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No. Publication Number Title Publication/Patent Number Publication/Patent Number Publication Date Publication Date
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Inventor Inventor Assignee Assignee IPC IPC
1 WO2020026477A1
THREE-DIMENSIONAL LASER-LIGHT-SCANNING DEVICE
Publication/Patent Number: WO2020026477A1 Publication Date: 2020-02-06 Application Number: 2019005773 Filing Date: 2019-02-18 Inventor: Shinozuka, Yukio   Assignee: KUMONOS CORPORATION   IPC: G01C15/00 Abstract: The present invention addresses the problem of providing a three-dimensional laser-light-scanning device that, without reducing laser-light distance-measurement performance, ensures safety for an ecosystem including people by preventing the formation of a high-density area having a high laser-light-irradiation density. To address this problem, a control unit (6) in this invention is made to control a first drive unit (3) and a second drive unit (7) so as to change the direction in which a reflection mirror (2) reflects laser light while controlling a laser-light distance-measurement device (1) so as to carry out laser-light distance-measurement. Thus, scanning is carried out such that the three-dimensional scanning range of the laser-light irradiation is wide. Further, scanning is carried out such that the rate of laser light irradiation decreases in a prescribed scanning range with, as a parameter, a latitude θ1 (0° ≤ θ1 ≤ 90°) on a virtual spherical surface (10) over which laser-light distance measurement is carried out.
2 EP3249352B1
OPTICAL DEVICE, FOCAL PLATE INCORPORATED IN OPTICAL DEVICE, AND MEASURING METHOD USING OPTICAL DEVICE
Publication/Patent Number: EP3249352B1 Publication Date: 2020-09-09 Application Number: 16868650.9 Filing Date: 2016-11-25 Inventor: Nakaniwa, Kazuhide   Assignee: Kumonos Corporation   IPC: G01C15/00
3 US10690478B2
Survey method and survey apparatus
Publication/Patent Number: US10690478B2 Publication Date: 2020-06-23 Application Number: 15/802,001 Filing Date: 2017-11-02 Inventor: Nakaniwa, Kazuhide   Assignee: Kumonos Corporation   IPC: G01C3/08 Abstract: A survey method comprises a first step for obtaining coordinates of first to fourth points on a wall surface; a second step for specifying first to fourth surfaces; a third step for obtaining distances δ4, δ1, δ2, δ3; a fourth step for determining a largest value δmax among the first to fourth distances δ1 to δ4 as an evaluation value; and a fifth step of defining any of the first to fourth surfaces as a specific surface specifying the wall surface if the evaluation value δmax is less than a predetermined threshold value δth.
4 EP3318842B1
SURVEY METHOD
Publication/Patent Number: EP3318842B1 Publication Date: 2019-07-17 Application Number: 17199717.4 Filing Date: 2017-11-02 Inventor: Nakaniwa, Kazuhide   Assignee: Kumonos Corporation   IPC: G01C15/00
5 EP3318842A1
SURVEY METHOD
Publication/Patent Number: EP3318842A1 Publication Date: 2018-05-09 Application Number: 17199717.4 Filing Date: 2017-11-02 Inventor: Nakaniwa, Kazuhide   Assignee: Kumonos Corporation   IPC: G01C15/00 Abstract: A survey method comprises a first step for obtaining coordinates of first to fourth points on a wall surface; a second step for specifying first to fourth surfaces; a third step for obtaining distances δ4, δ1, δ2, δ3; a fourth step for determining a largest value δmax among the first to fourth distances δ1 to δ4 as an evaluation value; and a fifth step of defining any of the first to fourth surfaces as a specific surface specifying the wall surface if the evaluation value δmax is less than a predetermined threshold value δth.
6 KR20180051388A
METHOD AND APPARATUS FOR SURVEY
Publication/Patent Number: KR20180051388A Publication Date: 2018-05-16 Application Number: 20170145155 Filing Date: 2017-11-02 Inventor: Nakaniwa, Kazuhide   Assignee: KUMONOS CORPORATION   IPC: G01C7/06 Abstract: (과제) 측량 대상이 되는 벽면에 뒤틀림이나 요철이 있어도 그 벽면을 정확하게 특정할 수 있다. (해결 수단) 벽면 상에 있는 제 1~제 4 점의 좌표를 구하는 제 1 공정; 제 1, 제 2, 및 제 3 점을 포함하는 제 1 면, 제 2, 제 3, 및 제 4 점을 포함하는 제 2 면, 제 3, 제 4, 및 제 1 점을 포함하는 제 3 면, 및 제 4, 제 1, 및 제 2 점을 포함하는 제 4 면을 특정하는 제 2 공정; 제 1 면과 제 4 점의 제 4 거리(δ4), 제 2 면과 제 1 점의 제 1 거리(δ1), 제 3 면과 제 2 점의 제 2 거리(δ2), 및 제 4 면과 제 3 점의 제 3 거리(δ3)를 구하는 제 3 공정; 제 1, 제 2, 제 3, 및 제 4 거리(δ1~δ4) 중 최대값(δmax)을 평가값으로 하는 제 4 공정; 평가값(δmax)이 미리 결정된 역치(δth) 미만인 경우, 상기 제 1~제 4 면 중 어느 하나를 상기 벽면을 특정하는 특정면으로 하는 제 5 공정을 갖는 측량 방법.
7 US201873872A1
OPTICAL DEVICE, FOCAL PLATE INCORPORATED IN THE OPTICAL DEVICE, AND MEASURING METHOD USING OPTICAL DEVICE
Publication/Patent Number: US201873872A1 Publication Date: 2018-03-15 Application Number: 20/161,555 Filing Date: 2016-11-25 Inventor: Nakaniwa, Kazuhide   Assignee: KUMONOS Corporation   IPC: G01C3/06 Abstract: Disclosed herein is an optical device that determines the central coordinates of a large-diameter cylindrical structure. The optical device has the function of calculating the central coordinates of a cylindrical structure using the coordinates of a reference point of the optical device, the coordinates of a survey point on the cylindrical structure seen on the optical axis of a telescope in a state where one of right and left reference marks (e.g., a vertical line) coincides with the edge of the cylindrical structure and the optical axis is positioned on the surface of the cylindrical structure, and an aperture angle between the optical axis and the reference mark.
8 US10107623B2
Optical device, reticle incorporated in the optical device, and survey method using the optical device
Publication/Patent Number: US10107623B2 Publication Date: 2018-10-23 Application Number: 15/559,983 Filing Date: 2016-11-25 Inventor: Nakaniwa, Kazuhide   Assignee: Kumonos Corporation   IPC: G01C3/04 Abstract: Disclosed herein is an optical device that determines the central coordinates of a large-diameter cylindrical structure. The optical device has the function of calculating the central coordinates of a cylindrical structure using the coordinates of a reference point of the optical device, the coordinates of a survey point on the cylindrical structure seen on the optical axis of a telescope in a state where one of right and left reference marks (e.g., a vertical line) coincides with the edge of the cylindrical structure and the optical axis is positioned on the surface of the cylindrical structure, and an aperture angle between the optical axis and the reference mark.
9 US2018128595A1
SURVEY METHOD AND SURVEY APPARATUS
Publication/Patent Number: US2018128595A1 Publication Date: 2018-05-10 Application Number: 15/802,001 Filing Date: 2017-11-02 Inventor: Nakaniwa, Kazuhide   Assignee: KUMONOS Corporation   IPC: G01S7/481 Abstract: A survey method comprises a first step for obtaining coordinates of first to fourth points on a wall surface; a second step for specifying first to fourth surfaces; a third step for obtaining distances δ4, δ1, δ2, δ3; a fourth step for determining a largest value δmax among the first to fourth distances δ1 to δ4 as an evaluation value; and a fifth step of defining any of the first to fourth surfaces as a specific surface specifying the wall surface if the evaluation value δmax is less than a predetermined threshold value δth.
10 US2018073872A1
OPTICAL DEVICE, FOCAL PLATE INCORPORATED IN THE OPTICAL DEVICE, AND MEASURING METHOD USING OPTICAL DEVICE
Publication/Patent Number: US2018073872A1 Publication Date: 2018-03-15 Application Number: 15/559,983 Filing Date: 2016-11-25 Inventor: Nakaniwa, Kazuhide   Assignee: KUMONOS Corporation   IPC: G01C3/06 Abstract: Disclosed herein is an optical device that determines the central coordinates of a large-diameter cylindrical structure. The optical device has the function of calculating the central coordinates of a cylindrical structure using the coordinates of a reference point of the optical device, the coordinates of a survey point on the cylindrical structure seen on the optical axis of a telescope in a state where one of right and left reference marks (e.g., a vertical line) coincides with the edge of the cylindrical structure and the optical axis is positioned on the surface of the cylindrical structure, and an aperture angle between the optical axis and the reference mark.
11 KR20170105626A
광학 장치
Title (English): CD-ROM
Publication/Patent Number: KR20170105626A Publication Date: 2017-09-19 Application Number: 20177024031 Filing Date: 2016-11-25 Inventor: Nakaniwa, Kazuhide   Assignee: KUMONOS CORPORATION   IPC: G01C15/00 Abstract: 대경 원통 구조물의 중심 좌표를 구하는 광학 장치를 제공한다. 광학 장치는 광학 장치의 기준점의 좌표와
12 USD798752S1
Focal plate for surveying instrument
Publication/Patent Number: USD798752S1 Publication Date: 2017-10-03 Application Number: 29/561,555 Filing Date: 2016-04-18 Inventor: Nakaniwa, Kazuhide   Assignee: KUMONOS Corporation   IPC:
13 WO2017090707A1
OPTICAL DEVICE
Publication/Patent Number: WO2017090707A1 Publication Date: 2017-06-01 Application Number: 2016084914 Filing Date: 2016-11-25 Inventor: Nakaniwa, Kazuhide   Assignee: KUMONOS CORPORATION   IPC: G01C15/00 Abstract: Provided is an optical device for obtaining the central coordinates of a large-diameter cylindrical structure. This optical device has a function for calculating the central coordinates of a cylindrical structure by using: the coordinates of a reference point of the optical device; the coordinates of a viewing reference point which is on the cylindrical structure and is viewed on the optical axis in a state in which one of left and right reference marks (for example
14 EP3249352A1
OPTICAL DEVICE, FOCAL PLATE INCORPORATED IN OPTICAL DEVICE, AND MEASURING METHOD USING OPTICAL DEVICE
Publication/Patent Number: EP3249352A1 Publication Date: 2017-11-29 Application Number: 16868650.9 Filing Date: 2016-11-25 Inventor: Nakaniwa, Kazuhide   Assignee: Kumonos Corporation   IPC: G01C15/00 Abstract: Disclosed herein is an optical device that determines the central coordinates of a large-diameter cylindrical structure. The optical device has the function of calculating the central coordinates of a cylindrical structure using the coordinates of a reference point of the optical device, the coordinates of a survey point on the cylindrical structure seen on the optical axis of a telescope in a state where one of right and left reference marks (e.g., a vertical line) coincides with the edge of the cylindrical structure and the optical axis is positioned on the surface of the cylindrical structure, and an aperture angle between the optical axis and the reference mark.