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1
TW201908997A
Method and system for evaluating driving risk
Publication/Patent Number: TW201908997A Publication Date: 2019-03-01 Application Number: 106124425 Filing Date: 2017-07-20 Inventor: Wu, Ruei-bin   Huang chung han   Wu, Tien-yu   Chu, Ching-yi   Hsieh, Chan-sheng   Assignee: CATHAY CENTURY INSURANCE   IPC: G06F17/18 Abstract: Disclosed herein are a method and a system for evaluating the driving risk. According to embodiments of the present disclosure, the method includes the following steps: sending a virtual reality video of driving to a test subject via a wearable audio/video device by use of an audio/video module, thereby providing the test subject a driving virtual reality; collecting at least one first behavioral factor and/ or second behavioral factor generated during the test subject's driving activity in the virtual reality provided in the step (a) by use of a detector; and generating an incident risk score based on the first behavior factors and/ or a hazard perception score based on the second behavior factors by use of a calculation module.
2
TWI632471B
Method and system for evaluating driving risk
Publication/Patent Number: TWI632471B Publication Date: 2018-08-11 Application Number: 106124425 Filing Date: 2017-07-20 Inventor: Wu, Ruei-bin   Huang chung han   Wu, Tien-yu   Chu, Ching-yi   Hsieh, Chan-sheng   Assignee: CATHAY CENTURY INSURANCE   IPC: G06F17/18 Abstract: Disclosed herein are a method and a system for evaluating the driving risk. According to embodiments of the present disclosure, the method includes the following steps: sending a virtual reality video of driving to a test subject via a wearable audio/video device by use of an audio/video module, thereby providing the test subject a driving virtual reality; collecting at least one first behavioral factor and/ or second behavioral factor generated during the test subject's driving activity in the virtual reality provided in the step (a) by use of a detector; and generating an incident risk score based on the first behavior factors and/ or a hazard perception score based on the second behavior factors by use of a calculation module.
3
US9952279B2
Apparatus for three dimensional integrated circuit testing
Publication/Patent Number: US9952279B2 Publication Date: 2018-04-24 Application Number: 13/724,004 Filing Date: 2012-12-21 Inventor: Chung, Meng-lin   Hsieh, Wen-wen   Chen, Ching-fang   Yuan, Chung-sheng   Huang chung han   Chen, Hao   Lin, Hung-chih   Peng, Ching-nen   Wang, Mill-jer   Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.   IPC: G01R1/073 Abstract: A three-dimensional integrated circuit testing apparatus comprises a probe card configured to couple a device-under-test of a three-dimensional integrated circuit with an automatic testing equipment board having a plurality of testing modules, wherein the probe card comprises a plurality of known good dies of the three-dimensional integrated circuit, a plurality of interconnects of the three-dimensional integrated circuit and a plurality of probe contacts, wherein the probe contacts are configured to couple the probe card with testing contacts of the device-under-test of the three-dimensional integrated circuit.
4
US9640447B2
Test circuit and method
Publication/Patent Number: US9640447B2 Publication Date: 2017-05-02 Application Number: 14/186,107 Filing Date: 2014-02-21 Inventor: Wang, Mill-jer   Peng, Ching-nen   Lin, Hung-chih   Chen, Hao   Huang chung han   Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.   IPC: G01R1/04 Abstract: A circuit is disclosed that includes a signal-forcing path, a discharging path, a contact probe, a monitoring probe and a switch module. The signal-forcing path is connected to a signal source. The discharging path is connected to a discharging voltage terminal. The contact probe contacts a pad module of an under-test device. The monitoring probe generates a monitored voltage associated with the pad module. The switch module is operated in a discharging mode to connect the contact probe to the discharging path when the monitored voltage does not reach a threshold voltage such that the under-test device is discharged and is operated in an operation mode to connect the contact probe to the signal-forcing path when the monitored voltage reaches the threshold voltage such that a signal generated by the signal source is forced to the under-test device.
5
US9606155B2
Capacitance measurement circuit and method
Publication/Patent Number: US9606155B2 Publication Date: 2017-03-28 Application Number: 14/132,722 Filing Date: 2013-12-18 Inventor: Wang, Mill-jer   Peng, Ching-nen   Lin, Hung-chih   Chen, Hao   Huang chung han   Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.   IPC: G01R27/26 Abstract: A circuit includes a stacked circuit layer, a plurality of test contact points, and a comparator. The stacked circuit layer includes a plurality of reference capacitors each having a reference capacitance. Each of the test contact points is electrically connecting to an under-test capacitor of an under-test module. The comparator compares the reference capacitance of one of the reference capacitors with an under-test capacitance of the under-test capacitor corresponding to one of the test contact points to measure a range of the under-test capacitance.
6
TWM552127U
System for evaluating driving risk
Publication/Patent Number: TWM552127U Publication Date: 2017-11-21 Application Number: 106210699 Filing Date: 2017-07-20 Inventor: Wu, Ruei-bin   Huang chung han   Wu, Tien-yu   Chu, Ching-yi   Hsieh, Chan-sheng   Assignee: CATHAY CENTURY INSURANCE   IPC: G06F17/18
7
US9372227B2
Integrated circuit test system and method
Publication/Patent Number: US9372227B2 Publication Date: 2016-06-21 Application Number: 13/792,323 Filing Date: 2013-03-11 Inventor: Wang, Mill-jer   Peng, Ching-nen   Lin, Hung-chih   Lin, Wei-hsun   Chen, Hao   Huang chung han   Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.   IPC: G01R31/20 Abstract: A system for testing a device under test (DUT) includes a probe card and a test module. The probe card includes probe beds electrically coupled to a circuit board and a first plurality of electrical contacts coupled to the circuit board, which are for engaging respective ones of a plurality of electrical contacts of a test equipment module. Probes are coupled to respective probe beds and are disposed to engage electrical contacts of the DUT. The probe card includes a second plurality of electrical contacts coupled to the circuit board. The first and second pluralities of contacts are mutually exclusive. The test module includes a memory, a processor, and a plurality of electrical contacts electrically coupled to respective ones of the second plurality of electrical contacts of the probe card. The circuit board includes a first electrical path for electrically coupling the test equipment module to the test module.
8
US8982919B2
Laser light source module, laser apparatus and lighting method therefor
Publication/Patent Number: US8982919B2 Publication Date: 2015-03-17 Application Number: 13/761,515 Filing Date: 2013-02-07 Inventor: Wu, Kuo-tung   Huang chung han   Wu, Tung-chin   Assignee: Delta Electronics, Inc.   IPC: H01S3/09 Abstract: A laser light source module includes a laser source, a connecting unit, a controlled switch unit, and a verification unit. When a verification signal is received, the verification unit judges whether the verification signal complies with a verifying condition. If the verification signal complies with the verifying condition, the controlled switch unit is in the on state, so that a first output voltage is transmitted to the laser source through the controlled switch unit to drive illumination of the laser source. Whereas, if the verification signal does not comply with the verifying condition, the controlled switch unit is in the off state, so that the first output voltage fails to be transmitted to the laser source through the controlled switch unit and the laser source is turned off.
9
US2015241508A1
Test Circuit And Method
Publication/Patent Number: US2015241508A1 Publication Date: 2015-08-27 Application Number: 14/186,107 Filing Date: 2014-02-21 Inventor: Wang, Mill-jer   Peng, Ching-nen   Lin, Hung-chih   Chen, Hao   Huang chung han   Assignee: Taiwan Semiconductor Manufacturing CO.,LTD.   IPC: G01R31/26 Abstract: A circuit is disclosed that includes a signal-forcing path, a discharging path, a contact probe, a monitoring probe and a switch module. The signal-forcing path is connected to a signal source. The discharging path is connected to a discharging voltage terminal. The contact probe contacts a pad module of an under-test device. The monitoring probe generates a monitored voltage associated with the pad module. The switch module is operated in a discharging mode to connect the contact probe to the discharging path when the monitored voltage does not reach a threshold voltage such that the under-test device is discharged and is operated in an operation mode to connect the contact probe to the signal-forcing path when the monitored voltage reaches the threshold voltage such that a signal generated by the signal source is forced to the under-test device.
10
US2015168459A1
Capacitance Measurement Circuit And Method
Publication/Patent Number: US2015168459A1 Publication Date: 2015-06-18 Application Number: 14/132,722 Filing Date: 2013-12-18 Inventor: Wang, Mill-jer   Peng, Ching-nen   Lin, Hung-chih   Chen, Hao   Huang chung han   Assignee: Taiwan Semiconductor Manufacturing CO., LTD.   IPC: G01R17/00 Abstract: A circuit that includes a stacked circuit layer, a plurality of test contact points and a comparator is disclosed. The stacked circuit layer includes a plurality of reference capacitors each having a reference capacitance. Each of the test contact points is electrically connecting to an under-test capacitor of an under-test module. The comparator compares the reference capacitance of one of the reference capacitors with an under-test capacitance of the under-test capacitor corresponding to one of the test contact points to measure a range of the under-test capacitance.
11
TWI461109B
Laser light source module
Publication/Patent Number: TWI461109B Publication Date: 2014-11-11 Application Number: 101116562 Filing Date: 2012-05-09 Inventor: Wu, Kuo Tung   Wu, Tung Chin   Huang, Chung Han   Assignee: Delta Electronics, Inc.   IPC: H05B33/08 Abstract: A laser light source module is disclosed. The laser light source module disposed in a laser device separately comprises a laser light source
12
US2014253162A1
INTEGRATED CIRCUIT TEST SYSTEM AND METHOD
Publication/Patent Number: US2014253162A1 Publication Date: 2014-09-11 Application Number: 13/792,323 Filing Date: 2013-03-11 Inventor: Wang, Mill-jer   Peng, Ching-nen   Lin, Hung-chih   Lin, Wei-hsun   Chen, Hao   Huang chung han   Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.   IPC: G01R31/28 Abstract: A system for testing a device under test (DUT) includes a probe card and a test module. The probe card includes probe beds electrically coupled to a circuit board and a first plurality of electrical contacts coupled to the circuit board, which are for engaging respective ones of a plurality of electrical contacts of a test equipment module. Probes are coupled to respective probe beds and are disposed to engage electrical contacts of the DUT. The probe card includes a second plurality of electrical contacts coupled to the circuit board. The first and second pluralities of contacts are mutually exclusive. The test module includes a memory, a processor, and a plurality of electrical contacts electrically coupled to respective ones of the second plurality of electrical contacts of the probe card. The circuit board includes a first electrical path for electrically coupling the test equipment module to the test module.
13
US2014176165A1
Apparatus for Three Dimensional Integrated Circuit Testing
Publication/Patent Number: US2014176165A1 Publication Date: 2014-06-26 Application Number: 13/724,004 Filing Date: 2012-12-21 Inventor: Wang, Mill-jer   Peng, Ching-nen   Lin, Hung-chih   Chen, Hao   Huang chung han   Yuan, Chung-sheng   Chen, Ching-fang   Hsieh, Wen-wen   Chung, Meng-lin   Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.   IPC: G01R31/26 Abstract: A three-dimensional integrated circuit testing apparatus comprises a probe card configured to couple a device-under-test of a three-dimensional integrated circuit with an automatic testing equipment board having a plurality of testing modules, wherein the probe card comprises a plurality of known good dies of the three-dimensional integrated circuit, a plurality of interconnects of the three-dimensional integrated circuit and a plurality of probe contacts, wherein the probe contacts are configured to couple the probe card with testing contacts of the device-under-test of the three-dimensional integrated circuit.
14
TW201347605A
Laser light source module
Publication/Patent Number: TW201347605A Publication Date: 2013-11-16 Application Number: 101116562 Filing Date: 2012-05-09 Inventor: Wu, Kuo Tung   Wu, Tung Chin   Huang, Chung Han   Assignee: Delta Electronics, Inc.   IPC: H05B33/08 Abstract: A laser light source module is disclosed. The laser light source module disposed in a laser device separately comprises a laser light source
15
US2013301665A1
LASER LIGHT SOURCE MODULE, LASER APPARATUS AND LIGHTING METHOD THEREFOR
Publication/Patent Number: US2013301665A1 Publication Date: 2013-11-14 Application Number: 13/761,515 Filing Date: 2013-02-07 Inventor: Wu, Kuo-tung   Huang chung han   Wu, Tung-chin   Assignee: DELTA ELECTRONICS, INC.   IPC: H01S3/09 Abstract: A laser light source module includes a laser source, a connecting unit, a controlled switch unit, and a verification unit. When a verification signal is received, the verification unit judges whether the verification signal complies with a verifying condition. If the verification signal complies with the verifying condition, the controlled switch unit is in the on state, so that a first output voltage is transmitted to the laser source through the controlled switch unit to drive illumination of the laser source. Whereas, if the verification signal does not comply with the verifying condition, the controlled switch unit is in the off state, so that the first output voltage fails to be transmitted to the laser source through the controlled switch unit and the laser source is turned off.
16
US2005237007A1
ELECTRONIC ALTERNATING-CURRENT REGULATOR
Publication/Patent Number: US2005237007A1 Publication Date: 2005-10-27 Application Number: 10/829,260 Filing Date: 2004-04-22 Inventor: Huang chung han   Assignee: Huang chung han   IPC: H05B037/02 Abstract: An electronic alternating-current regulator for supplying a high-voltage direct current for activating a discharging light tube for steady illumination comprises a power circuit, a voltage control circuit, an activation circuit and a load circuit. The voltage control circuit utilizes effects of a power factor rectification integrated circuit and a transistor to control a direct-current voltage. An over-voltage/leakage protection circuit is connected in parallel between the voltage control circuit and the activation circuit, and is for activating a PNP transistor connected between a base end of a first transistor and a bi-directional thyrator, thereby serving as a protection switch over operations of the activation circuit. Accordingly, an alternating current ranging from 95V to 265V can be applied to a power input end while over-voltage/leakage protection effects are offered.
17
TWM275529U
Power-saving bulb with negative ions
Publication/Patent Number: TWM275529U Publication Date: 2005-09-11 Application Number: 94206249 Filing Date: 2005-04-21 Inventor: Huang chung han   Assignee: SUPPORTER INDUSTRIAL LTD.   IPC: H01J63/00
18
US6923536B2
Spectacle strap-on apparatus
Publication/Patent Number: US6923536B2 Publication Date: 2005-08-02 Application Number: 10/701,512 Filing Date: 2003-11-06 Inventor: Huang chung han   Assignee: Besins Healthcare Luxembourg SARL   IPC: Abstract: A spectacle strap-on apparatus includes a pair of spectacles devised with a pair of lenses joined by a nose stand having two nose pads; and a pair of strap-on sunglasses. Wherein, the nose stand has auxiliary stands for connecting the two nose pads to the nose stand; and each auxiliary stand is provided with a fastening ring having a magnet inlaid at a center portion thereof. The strap-on sunglasses have a pair of lenses, and a nose stand connecting the two lenses. Wherein, the nose stand is fixed with a pair of fastening rings each having a magnet inlaid at a center portion thereof. Using the fastening rings of the strap-on sunglasses to adhere to the nose stand of the spectacles, the two magnets precisely come into contact with the two magnets at a rear portion of the nose stand of the spectacles, thereby firmly locating the strap-on sunglasses.
19
TWM261648U
Lamp bracket
Publication/Patent Number: TWM261648U Publication Date: 2005-04-11 Application Number: 93213638 Filing Date: 2004-08-27 Inventor: Huang chung han   Assignee: SUPPORTER INDUSTRIAL LTD.   IPC: F21V19/00
20
US2005099590A1
Spectacle strap-on apparatus
Publication/Patent Number: US2005099590A1 Publication Date: 2005-05-12 Application Number: 10/701,512 Filing Date: 2003-11-06 Inventor: Huang chung han   Assignee: Huang chung han   IPC: G02C009/00 Abstract: A spectacle strap-on apparatus includes a pair of spectacles devised with a pair of lenses joined by a nose stand having two nose pads; and a pair of strap-on sunglasses. Wherein, the nose stand has auxiliary stands for connecting the two nose pads to the nose stand; and each auxiliary stand is provided with a fastening ring having a magnet inlaid at a center portion thereof. The strap-on sunglasses have a pair of lenses, and a nose stand connecting the two lenses. Wherein, the nose stand is fixed with a pair of fastening rings each having a magnet inlaid at a center portion thereof. Using the fastening rings of the strap-on sunglasses to adhere to the nose stand of the spectacles, the two magnets precisely come into contact with the two magnets at a rear portion of the nose stand of the spectacles, thereby firmly locating the strap-on sunglasses.