My View
My Keyword Group
My Searches
Analyze
Patent Alerts
All
(0)
Total 364 results Used time 0.022 s
No. | Publication Number | Title | Publication/Patent Number Publication/Patent Number |
Publication Date
Publication Date
|
Application Number Application Number |
Filing Date
Filing Date
|
Inventor Inventor | Assignee Assignee |
IPC
IPC
|
|||||
![]() |
61 | US2018323320A1 |
OPTICAL PACKAGE AND METHOD OF PRODUCING AN OPTICAL PACKAGE
|
Publication/Patent Number: US2018323320A1 | Publication Date: 2018-11-08 | Application Number: 15/773,539 | Filing Date: 2016-11-04 | Inventor: Mehrl, David Bodner, Thomas Toschkoff, Gregor Etschmaier, Harald Schrank, Franz | Assignee: ams AG | IPC: H01L31/0232 | Abstract: An optical package is proposed comprising a carrier, an optoelectronic component, an aspheric lens, and a reflective layer. The carrier comprises electrical interconnections and the optoelectric component is arranged for emitting and/or detecting electromagnetic radiation in a specified wavelength range. Furthermore, the optoelectric component is mounted on the carrier or integrated into the carrier and electrically connected to the electric interconnections. The aspheric lens has an upper surface, a lateral surface, and a bottom surface and the bottom surface is arranged on or near the optoelectric component. The aspheric lens comprises a material which is at least transparent in the specified wavelength range. The reflective layer comprises a reflective material, wherein the reflective layer at least partly covers the lateral surface of the aspheric lens, and wherein the reflective material is at least partly reflective in the specified wavelength range. | |||
![]() |
62 | US2018006074A1 |
SENSOR CHIP STACK AND METHOD OF PRODUCING A SENSOR CHIP STACK
|
Publication/Patent Number: US2018006074A1 | Publication Date: 2018-01-04 | Application Number: 15/636,545 | Filing Date: 2017-06-28 | Inventor: Schrank, Franz Fitzi, Andreas Forsyth, Richard Fitzi, Andreas Parteder, Georg | Assignee: AMS International AG | IPC: H04N5/225 | Abstract: The sensor chip stack comprises a sensor substrate of a semiconductor material including a sensor, a chip fastened to the sensor substrate, the chip including an integrated circuit, electric interconnections between the sensor substrate and the chip, electric terminals of the chip, the chip being arranged between the electric terminals and the sensor substrate, and a molding material arranged adjacent to the chip, the electric terminals of the chip being free from the molding material. | |||
![]() |
63 | EP3267484A1 |
SENSOR CHIP STACK AND METHOD OF PRODUCING A SENSOR CHIP STACK
|
Publication/Patent Number: EP3267484A1 | Publication Date: 2018-01-10 | Application Number: 16177777.6 | Filing Date: 2016-07-04 | Inventor: Schrank, Franz Fitzi, Andreas Troxler, Thomas Kraft, Jochen Parteder, Georg | Assignee: ams international AG | IPC: H01L27/146 | Abstract: The sensor chip stack comprises a sensor substrate (1) of a semiconductor material including a sensor, a chip (10) fastened to the sensor substrate, the chip including an integrated circuit (11), electric interconnections (4) between the sensor substrate and the chip, electric terminals (19) of the chip, the chip being arranged between the electric terminals and the sensor substrate, and a molding material (13) arranged adjacent to the chip, the electric terminals of the chip being free from the molding material. | |||
![]() |
64 | TW201832341A |
Semiconductor device
|
Publication/Patent Number: TW201832341A | Publication Date: 2018-09-01 | Application Number: 107105265 | Filing Date: 2018-02-13 | Inventor: Schrank, Franz Kraft, Jochen Parteder, Georg Coppeta, Raffaele Singulani, Anderson | Assignee: AMS AG | IPC: H01L23/538 | Abstract: A semiconductor device (10) comprises a semiconductor body (11) and an electrically conductive via (12) which extends through at least a part of the semiconductor body (11), where the via (12) has a lateral size which is given in a first lateral direction (x) that is perpendicular to a vertical direction (z) given by the main axis of extension of the via (12) and where the via (12) has a top side (13) and a bottom side (14) that faces away from the top side (13). The semiconductor device (10) further comprises an electrically conductive etch-stop layer (15) arranged at the bottom side (14) of the via (12) in a plane which is parallel to the first lateral direction (x), and at least one electrically conductive contact layer (16) at the bottom side (14) of the via (12) in a plane which is parallel to the first lateral direction (x). The lateral extent in the first lateral direction (x) of the etch-stop layer (15) is larger than the lateral size of the via (12) and the lateral extent in the first lateral direction (x) of the contact layer (16) is smaller than the lateral size of the via (12). Furthermore, the etch-stop layer (15) is arranged between the electrically conductive via (12) and the contact layer (16) in the vertical direction (z). | |||
![]() |
65 | EP3364454A1 |
SEMICONDUCTOR DEVICE
|
Publication/Patent Number: EP3364454A1 | Publication Date: 2018-08-22 | Application Number: 17156319.0 | Filing Date: 2017-02-15 | Inventor: Kraft, Jochen Parteder, Georg Singulani, Anderson Coppeta, Raffaele Schrank, Franz | Assignee: AMS AG | IPC: H01L23/48 | Abstract: A semiconductor device (10) comprises a semiconductor body (11) and an electrically conductive via (12) which extends through at least a part of the semiconductor body (11), where the via (12) has a lateral size which is given in a first lateral direction (x) that is perpendicular to a vertical direction (z) given by the main axis of extension of the via (12) and where the via (12) has a top side (13) and a bottom side (14) that faces away from the top side (13). The semiconductor device (10) further comprises an electrically conductive etch-stop layer (15) arranged at the bottom side (14) of the via (12) in a plane which is parallel to the first lateral direction (x), and at least one electrically conductive contact layer (16) at the bottom side (14) of the via (12) in a plane which is parallel to the first lateral direction (x). The lateral extent in the first lateral direction (x) of the etch-stop layer (15) is larger than the lateral size of the via (12) and the lateral extent in the first lateral direction (x) of the contact layer (16) is smaller than the lateral size of the via (12). Furthermore, the etch-stop layer (15) is arranged between the electrically conductive via (12) and the contact layer (16) in the vertical direction (z). | |||
![]() |
66 | EP3301425A1 |
PRESSURE SENSOR DEVICE AND METHOD FOR FORMING A PRESSURE SENSOR DEVICE
|
Publication/Patent Number: EP3301425A1 | Publication Date: 2018-04-04 | Application Number: 16196616.3 | Filing Date: 2016-10-31 | Inventor: Siegert, Jörg Besling, Willem Frederik Adrianus Tak, Coenraad Cornelis Schrems, Martin Schrank, Franz | Assignee: ams International AG | IPC: G01L19/04 | Abstract: A pressure sensor device (10) comprises a substrate body (11), a pressure sensor (12) comprising a membrane (13), and a cap body (14) comprising at least one opening (15). The pressure sensor (12) is arranged between the substrate body (11) and the cap body (14) in a vertical direction (z) which is perpendicular to the main plane of extension of the substrate body (11), and the mass of the substrate body (11) equals approximately the mass of the cap body (14). Furthermore, a method for forming a pressure sensor device (10) is provided. | |||
![]() |
67 | US9543245B2 |
Semiconductor sensor device and method of producing a semiconductor sensor device
|
Publication/Patent Number: US9543245B2 | Publication Date: 2017-01-10 | Application Number: 14/441,165 | Filing Date: 2013-09-23 | Inventor: Schrank, Franz Schrems, Martin | Assignee: ams AG | IPC: G01N27/12 | Abstract: The semiconductor device comprises a substrate (1) of semiconductor material with a front side (4) and an opposite rear side (7), a wiring layer (5) at the front side (4), a further wiring layer (8) at the rear side (7), and a through-substrate via (3) connecting the wiring layer (5) and the further wiring layer (8). A hot plate (24) is arranged on or in the substrate, and a sensor layer (21) is arranged in the vicinity of the hot plate. A mold compound (14) is arranged on the rear side (7) above the substrate (1), a cavity (17) is formed in the mold compound (14) to accommodate the sensor layer (21), and the cavity (17) is covered with a membrane (15). | |||
![]() |
68 | EP2573829A3 |
Light emitting diode module
|
Publication/Patent Number: EP2573829A3 | Publication Date: 2017-01-25 | Application Number: 12198155.9 | Filing Date: 2007-10-16 | Inventor: Schrank, Franz Hoschopf, Hans | Assignee: Tridonic Jennersdorf GmbH Lumitech Produktion und Entwicklung GmbH | IPC: H01L33/52 | Abstract: A method for manufacturing a electronic and/or optoelectronic module comprises the following steps: - mounting a electronic and/or optoelectronic chip on a board, - making on the board an outer ring made from a liquid resin, the outer ring surrounding the electronic and/or optoelectronic chip, - making a central filling of the volume defined by the outer ring, the central filling being made from a liquid resin and covering the top surface of the electronic and/or optoelectronic chip, - curing in one single step the resin of the outer ring and the central filling and making a chemically linked interface between the outer ring and the central filling. | |||
![]() |
69 | US9574723B2 |
LED module, LED illumination means, and LED lamp for the energy-efficient reproduction of white light
|
Publication/Patent Number: US9574723B2 | Publication Date: 2017-02-21 | Application Number: 14/944,065 | Filing Date: 2015-11-17 | Inventor: Baumgartner, Erwin Schrank, Franz | Assignee: LUMITECH PRODUKTION UND ENTWICKLUNG GMBH | IPC: H01J1/62 | Abstract: An LED module, selectively comprising at least zero, one, or a plurality of LEDs from Group B and/or Group G and/or Group R and at least one or more LEDs from Group P. The concentration of phosphors/phosphor mixtures of the LEDs in Group P is selected such that the photometric efficiency (lm/W) thereof is at or near the maximum as a function of the CIE x-coordinates. | |||
![]() |
70 | US9570390B2 |
Semiconductor device with integrated hot plate and recessed substrate and method of production
|
Publication/Patent Number: US9570390B2 | Publication Date: 2017-02-14 | Application Number: 14/651,197 | Filing Date: 2013-12-05 | Inventor: Schrank, Franz Schrems, Martin | Assignee: AMS AG | IPC: H01L23/34 | Abstract: The semiconductor device comprises a substrate of semiconductor material, a dielectric layer on the substrate, an electrically conductive contact pad arranged in the dielectric layer, a hot plate arranged in the dielectric layer, a recess of the substrate at the location of the hot plate, and an integrated circuit, which operates the hot plate. An electrically conductive layer is arranged on a side of the substrate opposite the dielectric layer. The substrate is provided with a via hole above the contact pad, and an electrically conductive material connecting the electrically conductive layer with the contact pad is applied in the via hole. The recess and the via hole are formed in the same process step. | |||
![]() |
71 | DE102011009373B4 |
Fotodiodenbauelement
Title (English):
Photoelectric component
|
Publication/Patent Number: DE102011009373B4 | Publication Date: 2017-08-03 | Application Number: 102011009373 | Filing Date: 2011-01-25 | Inventor: Schrank, Franz Teva, Jordi Dr | Assignee: Austriamicrosystems AG | IPC: H01L27/146 | Abstract: Fotodiodenbauelement mit – einer elektrisch leitfähigen Kathodenschicht (3) an einer Fotodiodenschicht (4) aus einem Halbleitermaterial | |||
![]() |
72 | US9684074B2 |
Optical sensor arrangement and method of producing an optical sensor arrangement
|
Publication/Patent Number: US9684074B2 | Publication Date: 2017-06-20 | Application Number: 15/101,893 | Filing Date: 2014-12-03 | Inventor: Schrank, Franz Dierschke, Eugene G. Schrems, Martin | Assignee: AMS AG | IPC: H01L33/00 | Abstract: An optical sensor arrangement, in particular an optical proximity sensor arrangement comprises a three-dimensional integrated circuit further comprising a first layer comprising a light-emitting device, a second layer comprising a light-detector and a driver circuit. The driver circuit is electrically connected to the light-emitting device and to the light-detector to control the operation of the light-emitting device and the light-detector. A mold layer comprising a first light-barrier between the light-emitting device and the light-detector configured to block light from being transmitted directly from the light-emitting device to the light-detector. | |||
![]() |
73 | EP3211303A1 |
LED-MODULE
|
Publication/Patent Number: EP3211303A1 | Publication Date: 2017-08-30 | Application Number: 17154292.1 | Filing Date: 2017-02-02 | Inventor: Fink, Bernhard Schrank, Franz Pfeiler-deutschmann, Martin | Assignee: Tridonic Jennersdorf GmbH | IPC: F21Y105/14 | Abstract: Die Erfindung bezieht sich auf ein LED-Modul (10), insbesondere LED-Spotlight Modul, umfassend: - ein Gehäuseelement (11) vorzugsweise aus Kunststoff, mit zumindest einer Lichtabgabeöffnung (12); - zumindest eine Modulplatte mit zumindest einem Lichtfeld (13), auf dem zumindest eine Leuchtdiode (14) angeordnet ist, wobei die Modulplatte derart am Gehäuseelement (11) angeordnet ist, dass das Lichtfeld (13) in der oder unterhalb der Lichtabgabeöffnung (12) des Gehäuseelements (11) angeordnet ist, und wobei die Modulplatte eine Leiterplatte (15) und eine Trägerplatte (16) umfasst; - wobei an der Innenseite der Lichtabgabeöffnung (12) zumindest ein umlaufendes Wärmeleitelement (17) angeordnet ist, das mit der Trägerplatte (16) der Modulplatte thermisch in Kontakt steht, - wobei das Wärmeleitelement (17) zumindest zwei Anlageflächen (20) umfasst, die mit der Trägerplatte (16) oder mit korrespondierend ausgebildeten Anlageflächen der Trägerplatte (16) in thermischen Kontakt stehen. | |||
![]() |
74 | US2017365551A1 |
METHOD OF PRODUCING A SEMICONDUCTOR DEVICE WITH THROUGH-SUBSTRATE VIA COVERED BY A SOLDER BALL
|
Publication/Patent Number: US2017365551A1 | Publication Date: 2017-12-21 | Application Number: 15/691,654 | Filing Date: 2017-08-30 | Inventor: Cassidy, Cathal Schrems, Martin Schrank, Franz | Assignee: ams AG | IPC: H01L23/522 | Abstract: A semiconductor substrate is provided with an annular cavity extending from a front side of the substrate to an opposite rear side. A metallization is applied in the annular cavity, thereby forming a through-substrate via and leaving an opening of the annular cavity at the front side. A solder ball is placed above the opening and a reflow of the solder ball is effected, thereby forming a void of the through-substrate via, the void being covered by the solder ball. | |||
![]() |
75 | EP3121853A1 |
METHOD OF PRODUCING AN OPTICAL SENSOR AT WAFER-LEVEL AND OPTICAL SENSOR
|
Publication/Patent Number: EP3121853A1 | Publication Date: 2017-01-25 | Application Number: 15178053.3 | Filing Date: 2015-07-23 | Inventor: Etschmaier, Harald Toschkoff, Gregor Bodner, Thomas Schrank, Franz | Assignee: ams AG | IPC: H01L31/0203 | Abstract: A method of producing an optical sensor at wafer-level, comprising the steps of providing a wafer (1) having a main top surface (10) and a main back surface (13) and arrange at or near the top surface (10) of the wafer at least one first integrated circuit (11) having at least one light sensitive component (12). Furthermore, providing in the wafer (1) at least one through-substrate via (14) for electrically contacting the at least one first integrated circuit (11) via the back surface (13) and forming a transparent first mold structure (2) by wafer-level molding a first mold material over the top surface (10) of the wafer (1), such that the first mold structure (2) at least partly encloses the first integrated circuit (11). Finally, forming an opaque second mold structure (3) by wafer-level molding a second mold material over the first mold structure (2), such that the second mold structure (3) at least partly encloses the first mold structure (2), leaving an aperture (30) open on top of the at least one top surface (21) of the transparent first mold structure (2). | |||
![]() |
76 | EP3193368A1 |
AN OPTOELECTRONIC DEVICE WITH A REFRACTIVE ELEMENT AND A METHOD OF PRODUCING SUCH AN OPTOELECTRONIC DEVICE
|
Publication/Patent Number: EP3193368A1 | Publication Date: 2017-07-19 | Application Number: 16151134.0 | Filing Date: 2016-01-13 | Inventor: Schrank, Franz Siegert, JÖrg Hofrichter, Jens | Assignee: ams AG | IPC: H01L27/146 | Abstract: A top surface (10) of a substrate (1) is provided with a detection element (5) for detecting electromagnetic radiation. A refractive element (23) is formed by a portion of a cover element (2), which is attached to the substrate (1), so that the refractive element (23) is arranged facing the detection element (5). The refractive element (23) may be arranged within a recess (22) of the cover element (2), so that a cavity (4) is formed between the detection element (5) and the refraction element (23). | |||
![]() |
77 | WO2017121572A1 |
AN OPTOELECTRONIC DEVICE WITH A REFRACTIVE ELEMENT AND A METHOD OF PRODUCING SUCH AN OPTOELECTRONIC DEVICE
|
Publication/Patent Number: WO2017121572A1 | Publication Date: 2017-07-20 | Application Number: 2016081224 | Filing Date: 2016-12-15 | Inventor: Schrank, Franz Hofrichter, Jens Siegert, JÖrg | Assignee: AMS AG | IPC: H01L27/146 | Abstract: A top surface (10) of a substrate (1) is provided with a detection element (5) for detecting electromagnetic radiation. A refractive element (23) is formed by a portion of a cover element (2) | |||
![]() |
78 | US9818724B2 |
Interposer-chip-arrangement for dense packaging of chips
|
Publication/Patent Number: US9818724B2 | Publication Date: 2017-11-14 | Application Number: 14/561,164 | Filing Date: 2014-12-04 | Inventor: Kraft, Jochen Schrems, Martin Schrank, Franz | Assignee: AMS AG | IPC: H01L23/495 | Abstract: The interposer-chip-arrangement comprises an interposer (1), metal layers arranged above a main surface (10), a further metal layer arranged above a further main surface (11) opposite the main surface, an electrically conductive interconnection (7) through the interposer, the interconnection connecting one of the metal layers and the further metal layer, a chip (12) arranged at the main surface or at the further main surface, the chip having a contact pad (15), which is electrically conductively connected with the interconnection, a dielectric layer (2) arranged above the main surface with the metal layers embedded in the dielectric layer, a further dielectric layer (3) arranged above the further main surface with the further metal layer embedded in the further dielectric layer, and an integrated circuit (25) in the interposer, the integrated circuit being connected with at least one of the metal layers (5). | |||
![]() |
79 | US2017025351A1 |
SEMICONDUCTOR DEVICE WITH THROUGH-SUBSTRATE VIA COVERED BY A SOLDER BALL
|
Publication/Patent Number: US2017025351A1 | Publication Date: 2017-01-26 | Application Number: 15/283,183 | Filing Date: 2016-09-30 | Inventor: Cassidy, Cathal Schrems, Martin Schrank, Franz | Assignee: ams AG | IPC: H01L23/522 | Abstract: The semiconductor device comprises a semiconductor substrate (10) with a metallization (111) having an upper terminal layer (22) located at a front side (20) of the substrate. The metallization forms a through-substrate via (23) from the upper terminal layer to a rear terminal layer (13) located opposite to the front side at a rear side (21) of the substrate. The through-substrate via comprises an annular cavity (18) and a void (101), which may be filled with air or another gas. A solder ball (100) closes the void without completely filling it. A variety of interconnections for three-dimensional integration is offered by this scheme. | |||
![]() |
80 | US9553039B2 |
Semiconductor device with through-substrate via covered by a solder ball and related method of production
|
Publication/Patent Number: US9553039B2 | Publication Date: 2017-01-24 | Application Number: 14/359,568 | Filing Date: 2012-11-07 | Inventor: Cassidy, Cathal Schrems, Martin Schrank, Franz | Assignee: AMS AG | IPC: H01L23/48 | Abstract: The semiconductor device comprises a semiconductor substrate (10) with a metallization (111) having an upper terminal layer (22) located at a front side (20) of the substrate. The metallization forms a through-substrate via (23) from the upper terminal layer to a rear terminal layer (13) located opposite to the front side at a rear side (21) of the substrate. The through-substrate via comprises a void (101), which may be filled with air or another gas. A solder ball (100) closes the void without completely filling it. A variety of interconnections for three dimensional integration is offered by this scheme. |