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1
US2020135985A1
LIGHT-EMITTING DEVICES AND METHOD FOR FABRICATING THE SAME
Publication/Patent Number: US2020135985A1 Publication Date: 2020-04-30 Application Number: 16/176,970 Filing Date: 2018-10-31 Inventor: Wang wei ko   Wu, Chia-hui   Assignee: VisEra Technologies Company Limited   IPC: H01L33/50 Abstract: A light-emitting device is provided. The light-emitting device includes a substrate including a plurality of pixels, each pixel including a plurality of subpixels designed to emit light with different colors. The plurality of subpixels includes a first subpixel designed to emit red light, a second subpixel designed to emit green light, and a third subpixel designed to emit blue light. The first subpixel includes a first light source formed on the substrate, a red light-emitting layer covering the first light source, and a first yellow color filter covering the red light-emitting layer. The second subpixel includes a second light source formed on the substrate, a green light-emitting layer covering the second light source, and a second yellow color filter covering the green light-emitting layer. The third subpixel includes a third light source formed on the substrate. A method for fabricating the light-emitting device is also provided.
2
US10804441B2
Light-emitting device with yellow color filters
Publication/Patent Number: US10804441B2 Publication Date: 2020-10-13 Application Number: 16/176,970 Filing Date: 2018-10-31 Inventor: Wang wei ko   Wu, Chia-hui   Assignee: Visera Technologies Company Limited   IPC: H01L33/50 Abstract: A light-emitting device is provided. The light-emitting device includes a substrate including a plurality of pixels, each pixel including a plurality of subpixels designed to emit light with different colors. The plurality of subpixels includes a first subpixel designed to emit red light, a second subpixel designed to emit green light, and a third subpixel designed to emit blue light. The first subpixel includes a first light source formed on the substrate, a red light-emitting layer covering the first light source, and a first yellow color filter covering the red light-emitting layer. The second subpixel includes a second light source formed on the substrate, a green light-emitting layer covering the second light source, and a second yellow color filter covering the green light-emitting layer. The third subpixel includes a third light source formed on the substrate. A method for fabricating the light-emitting device is also provided.
3
US10670784B2
Light filter structure and image sensor
Publication/Patent Number: US10670784B2 Publication Date: 2020-06-02 Application Number: 15/597,979 Filing Date: 2017-05-17 Inventor: Wang wei ko   Chen, Yu-jen   Wu, Chia-hui   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: G02B5/00 Abstract: A light filter structure is provided. The light filter structure includes a first filter layer disposed over the substrate. The first filter layer has a transmittance greater than 50% in a first waveband, wherein the first filter layer is an interference-type filter. The light filter structure further includes a second filter layer disposed over the substrate. The second filter layer has a transmittance greater than 50% in a second waveband, wherein the second filter layer is an absorption-type filter. The first waveband partially overlaps the second waveband at the wavelength in a third waveband, and the third waveband is in an IR region. Furthermore, an image sensor used as a time-of-flight image sensor is also provided.
4
US10249771B2
Filter collimators and methods for forming the same
Publication/Patent Number: US10249771B2 Publication Date: 2019-04-02 Application Number: 15/661,254 Filing Date: 2017-07-27 Inventor: Wang wei ko   Assignee: Visera Technologies Company Limited   IPC: H01L27/146 Abstract: A filter collimator is provided. The filter collimator includes a substrate having a photodiode. The filter collimator also includes an interference-type and an absorption-type filter film disposed over the substrate. When a first light is incident at a first angle relative to the normal of the top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a first waveband, and when a second light is incident at a second angle relative to the normal of the top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a second waveband, the absorption-type filter film has a transmittance greater than 50% in a third waveband, and wherein the first waveband partially overlaps the third waveband, the second waveband does not overlap the third waveband, and the second angle is greater than the first angle.
5
TW201910868A
Filter collimators and the mathods for forming the same
Publication/Patent Number: TW201910868A Publication Date: 2019-03-16 Application Number: 106130619 Filing Date: 2017-09-07 Inventor: Wang wei ko   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: G02B27/30 Abstract: A filter collimator is provided. The filter collimator includes a substrate having a photodiode. The filter collimator also includes an interference-type and an absorption-type filter film disposed over the substrate. When a first light is incident at a first angle relative to a normal of a top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a first waveband, and when a second light is incident at a second angle relative to the normal of the top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a second waveband, the absorption-type filter film has a transmittance greater than 50% in a third waveband, and wherein the first waveband partially overlaps with the third waveband, the second waveband does not overlap with the third waveband, and the second angle is greater than the first angle.
6
US2019035947A1
FILTER COLLIMATORS AND METHODS FOR FORMING THE SAME
Publication/Patent Number: US2019035947A1 Publication Date: 2019-01-31 Application Number: 15/661,254 Filing Date: 2017-07-27 Inventor: Wang wei ko   Assignee: VisEra Technologies Company Limited   IPC: H01L31/0216 Abstract: A filter collimator is provided. The filter collimator includes a substrate having a photodiode. The filter collimator also includes an interference-type and an absorption-type filter film disposed over the substrate. When a first light is incident at a first angle relative to the normal of the top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a first waveband, and when a second light is incident at a second angle relative to the normal of the top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a second waveband, the absorption-type filter film has a transmittance greater than 50% in a third waveband, and wherein the first waveband partially overlaps the third waveband, the second waveband does not overlap the third waveband, and the second angle is greater than the first angle.
7
US10295482B1
Spectrum-inspection device and method for forming the same
Publication/Patent Number: US10295482B1 Publication Date: 2019-05-21 Application Number: 15/853,353 Filing Date: 2017-12-22 Inventor: Chen, Yu-jen   Wang wei ko   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: H04N9/077 Abstract: A spectrum-inspection device includes a substrate including a first photodiode and a second photodiode. The spectrum-inspection device also includes an interference-type filter disposed over the first and second photodiodes. The interference-type filter allows a first light beam with wavelength of a multi-band to pass through. The multi-band includes a first waveband, a second waveband, a third waveband, and a fourth waveband. The spectrum-inspection device also includes a first absorption-type filter disposed over the first and second photodiodes. The first absorption-type filter allows a second light beam with wavelength of a first region to pass through. The spectrum-inspection device further includes a second absorption-type filter disposed over the second photodiode. The second absorption-type filter is disposed over the first absorption-type filter and allows a third light beam with wavelength of a second region to pass through, wherein the second region overlaps the first region.
8
TWI668416B
Spectrum-inspection devices and methods for forming the same
Publication/Patent Number: TWI668416B Publication Date: 2019-08-11 Application Number: 107135045 Filing Date: 2018-10-04 Inventor: Chen, Yu-jen   Wang wei ko   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: G01J3/28 Abstract: A spectrum-inspection device includes a substrate including a first photodiode and a second photodiode. The spectrum-inspection device also includes an interference-type filter disposed over the first and second photodiodes. The interference-type filter allows a first light beam with wavelength of a multi-band to pass through. The spectrum-inspection device also includes a first absorption-type filter disposed over the first and second photodiodes. The first absorption-type filter allows a second light beam with wavelength of a first region to pass through. The spectrum-inspection device further includes a second absorption-type filter disposed over the second photodiode. The second absorption-type filter allows a third light beam with wavelength of a second region to pass through, wherein the second region overlaps the first region.
9
JP2019113519A
SPECTRUM MEASURING DEVICE AND MANUFACTURING METHOD THEREOF
Publication/Patent Number: JP2019113519A Publication Date: 2019-07-11 Application Number: 2018116135 Filing Date: 2018-06-19 Inventor: Wang wei ko   Chin, Hirohito   Assignee: VISERA TECHNOLOGIES COMPANY LTD   IPC: H01L31/10 Abstract: To provide a spectrum measuring device having an absorption type filter and an interference type filter for improving a spectrometer, and to provide its measurement method.SOLUTION: A spectrum measuring device includes: a board including a first photodiode and a second photodiode; an interference type filter that is disposed on the first photodiode and the second photodiode and allows first rays having a multiband wavelength including a first wavelength band (a), a second wavelength band (b), a third wavelength band (c), and a fourth wavelength band (d); a first absorption type filter that is disposed on the first photodiode and the second photodiode and allows second rays having a wavelength in a first area to pass; and a second absorption type filter that is disposed on the second photodiode and is disposed on the first absorption type filter, and allows third rays having a wavelength in a second area overlapping with the first area to pass.SELECTED DRAWING: Figure 4
10
TW201928310A
Spectrum-inspection devices and methods for forming the same
Publication/Patent Number: TW201928310A Publication Date: 2019-07-16 Application Number: 107135045 Filing Date: 2018-10-04 Inventor: Chen, Yu-jen   Wang wei ko   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: G01J3/28 Abstract: A spectrum-inspection device includes a substrate including a first photodiode and a second photodiode. The spectrum-inspection device also includes an interference-type filter disposed over the first and second photodiodes. The interference-type filter allows a first light beam with wavelength of a multi-band to pass through. The spectrum-inspection device also includes a first absorption-type filter disposed over the first and second photodiodes. The first absorption-type filter allows a second light beam with wavelength of a first region to pass through. The spectrum-inspection device further includes a second absorption-type filter disposed over the second photodiode. The second absorption-type filter allows a third light beam with wavelength of a second region to pass through, wherein the second region overlaps the first region.
11
US10192915B1
Optical sensor and manufacturing method thereof
Publication/Patent Number: US10192915B1 Publication Date: 2019-01-29 Application Number: 15/652,759 Filing Date: 2017-07-18 Inventor: Wang wei ko   Cheng, Yueh-ching   Wu, Chia-hui   Assignee: Visera Technologies Company Limited   IPC: H01L27/00 Abstract: An optical sensor includes a sensing layer, a first shading filter, a second shading filter, and an alignment mark. The sensing layer includes an active area, a shading area, and a peripheral area. The sensing layer includes sensing units located in the active area. The first shading filter is disposed on the shading area. The second shading filter is disposed on the first shading filter. The alignment mark is disposed on the peripheral area. When a light beam is emitted to the shading area, the second shading filter is configured to block a first component of the light beam, and the first shading filter is configured to block a second component of the light beam.
12
TW201901943A
Light filter structures and image sensors
Publication/Patent Number: TW201901943A Publication Date: 2019-01-01 Application Number: 106141151 Filing Date: 2017-11-27 Inventor: Chen, Yu-jen   Wu, Chia-hui   Wang wei ko   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: G02B5/20 Abstract: A light filter structure is provided. The light filter structure includes a first filter layer disposed over the substrate. The first filter layer has a transmittance greater than 50% in a first waveband, wherein the first filter layer is an interference-type filter. The light filter structure further includes a second filter layer disposed over the substrate. The second filter layer has a transmittance greater than 50% in a second waveband, wherein the second filter layer is an absorption-type filter. The first waveband partially overlaps the second waveband at the wavelength in a third waveband, and the third waveband is in an IR region. Furthermore, an image sensor used as a time-of-flight image sensor is also provided.
13
TW201909395A
Optical sensor and manufacturing method thereof
Publication/Patent Number: TW201909395A Publication Date: 2019-03-01 Application Number: 107116778 Filing Date: 2018-05-17 Inventor: Wu, Chia-hui   Wang wei ko   Cheng, Yueh-ching   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: H01L27/14 Abstract: An optical sensor includes a sensing layer, a first shading filter, a second shading filter, and an alignment mark for manufacturing. The sensing layer includes an active area, a shading area, and a peripheral area. The sensing layer includes sensing units located in the active area. The first shading filter is disposed on the shading area. The second shading filter is disposed on the first shading filter. The alignment mark is disposed on the peripheral area. When a light beam is emitted to the shading area, the second shading filter is configured to block a first component of the light beam, and the first shading filter is configured to block a second component of the light beam.
14
US2019027525A1
OPTICAL SENSOR AND MANUFACTURING METHOD THEREOF
Publication/Patent Number: US2019027525A1 Publication Date: 2019-01-24 Application Number: 15/652,759 Filing Date: 2017-07-18 Inventor: Wang wei ko   Cheng, Yueh-ching   Wu, Chia-hui   Assignee: VisEra Technologies Company Limited   IPC: H01L27/146 Abstract: An optical sensor includes a sensing layer, a first shading filter, a second shading filter, and an alignment mark. The sensing layer includes an active area, a shading area, and a peripheral area. The sensing layer includes sensing units located in the active area. The first shading filter is disposed on the shading area. The second shading filter is disposed on the first shading filter. The alignment mark is disposed on the peripheral area. When a light beam is emitted to the shading area, the second shading filter is configured to block a first component of the light beam, and the first shading filter is configured to block a second component of the light beam.
15
US10488639B2
Detection device for specimens
Publication/Patent Number: US10488639B2 Publication Date: 2019-11-26 Application Number: 14/878,272 Filing Date: 2015-10-08 Inventor: Chang, Chin-ching   Wu, Han-lin   Hsieh, Chin-chuan   Wang wei ko   Tu, Zong-ru   Assignee: Visera Technologies Company Limited   IPC: G02B21/00 Abstract: A detection device for specimens includes an image sensor, a light-guiding structure, and a carrier. The image sensor includes a sensing area and a non-sensing area around the sensing area. The light-guiding structure is disposed on the image sensor. The light-guiding structure includes a central guiding portion, a reflection layer, and first guiding portions. The central guiding portion is located over the sensing area. The reflection layer is disposed on the image sensor and includes channels located over the non-sensing area. The first guiding portions are located in the channels, and connected to the central guiding portion and a side surface of the light-guiding structure. The carrier is disposed on the light-guiding structure, and has wells located over the sensing area. Each of the wells is configured to receive a specimen.
16
US9906706B2
Image sensor and imaging device
Publication/Patent Number: US9906706B2 Publication Date: 2018-02-27 Application Number: 14/757,475 Filing Date: 2015-12-23 Inventor: Wang wei ko   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: G02B3/00 Abstract: The present invention provides an image sensor, including: a sensor array layer including a plurality of normal sensor units and a pair of autofocus sensor units; a plurality of color filter units disposed on the sensor array layer to cover the plurality of normal sensor units; a pair of IR-pass filter units disposed on the sensor array layer to respectively cover the pair of autofocus sensor units; a micro-lens layer including a plurality of micro-lenses disposed on the color filter units and the IR-pass filter units, wherein one of the pair of autofocus sensor units detects infrared light came from a first side, and the other of the pair of autofocus sensor units detects infrared light came from a second side opposite to the first side to perform a phase detection autofocus function.
17
TWI629515B
Filter collimators and the mathods for forming the same
Publication/Patent Number: TWI629515B Publication Date: 2018-07-11 Application Number: 106130619 Filing Date: 2017-09-07 Inventor: Wang wei ko   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: G02B27/30 Abstract: A filter collimator is provided. The filter collimator includes a substrate having a photodiode. The filter collimator also includes an interference-type and an absorption-type filter film disposed over the substrate. When a first light is incident at a first angle relative to a normal of a top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a first waveband, and when a second light is incident at a second angle relative to the normal of the top surface of the substrate, the interference-type filter film has a transmittance greater than 50% in a second waveband, the absorption-type filter film has a transmittance greater than 50% in a third waveband, and wherein the first waveband partially overlaps with the third waveband, the second waveband does not overlap with the third waveband, and the second angle is greater than the first angle.
18
US9972651B2
Spectrum-inspection device
Publication/Patent Number: US9972651B2 Publication Date: 2018-05-15 Application Number: 14/816,543 Filing Date: 2015-08-03 Inventor: Wang wei ko   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: H01L27/144 Abstract: A spectrum-inspection device includes a multi-band pass filter, a filter array, and a sensing layer. The multi-band pass filter allows a first waveband, a second waveband, and a third waveband of a light beam to pass through. The light beam passes through the multi-band pass filter forms a multi-band beam. The filter array is disposed under the multi-band pass filter. The filter array includes a first filter allowing wavelengths of the multi-band beam longer than a first wavelength to pass through, a second filter allowing wavelengths of the multi-band beam longer than a second wavelength to pass through, and a third filter allowing wavelengths of the multi-band beam longer than a third wavelength to pass through. The second waveband is between the first wavelength and the second wavelength, and the third waveband is between the second wavelength and the third wavelength.
19
TWI615637B
Image-sensor structures
Publication/Patent Number: TWI615637B Publication Date: 2018-02-21 Application Number: 105139646 Filing Date: 2016-12-01 Inventor: Wang, Wei Ko   Hsieh, Chin Chuan   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: H04N5/335 Abstract: An image-sensor structure is provided. The image-sensor structure includes a plurality of color filter patterns divided into a first unit including one green filter, a second unit including one green filter, a third unit including one blue filter, and a fourth unit including one red filter, wherein the first unit is adjacent to the second unit; and a plurality of microlenses formed above the color filter patterns, wherein the microlenses are divided into a first microlens unit having one microlens above the one green filter of the first unit and the one green filter of the second unit, a second microlens unit above the one blue filter of the third unit, and a third microlens unit above the one red filter of the fourth unit.
20
TW201804175A
Image-sensor structures
Publication/Patent Number: TW201804175A Publication Date: 2018-02-01 Application Number: 105139646 Filing Date: 2016-12-01 Inventor: Wang, Wei Ko   Hsieh, Chin Chuan   Assignee: VISERA TECHNOLOGIES COMPANY LIMITED   IPC: G02B3/00 Abstract: An image-sensor structure is provided. The image-sensor structure includes a plurality of color filter patterns divided into a first unit including one green filter, a second unit including one green filter, a third unit including one blue filter, and a fourth unit including one red filter, wherein the first unit is adjacent to the second unit; and a plurality of microlenses formed above the color filter patterns, wherein the microlenses are divided into a first microlens unit having one microlens above the one green filter of the first unit and the one green filter of the second unit, a second microlens unit above the one blue filter of the third unit, and a third microlens unit above the one red filter of the fourth unit.
Total 6 pages