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No. Publication Number Title Publication/Patent Number Publication/Patent Number Publication Date Publication Date
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21 TW201816978A
Systems and methods for protecting a semiconductor device
Publication/Patent Number: TW201816978A Publication Date: 2018-05-01 Application Number: 106113722 Filing Date: 2017-04-25 Inventor: Chou, Kuo-yu   Yeh shang fu   Lee, Chih-lin   Chao, Yi-ping   Assignee: Taiwan Semiconductor Manufacturing Company Ltd.   IPC: H01L23/60 Abstract: Circuits and methods for protecting a device are provided. A first device to be protected includes a gate dielectric of a first thickness. A second device includes a gate dielectric of a second thickness that is less than the first thickness. A gate is shared by the first device and the second device.
22 US10157906B2
Systems and methods for protecting a semiconductor device
Publication/Patent Number: US10157906B2 Publication Date: 2018-12-18 Application Number: 15/226,995 Filing Date: 2016-08-03 Inventor: Chou, Kuo-yu   Yeh shang fu   Chao, Yi-ping   Lee, Chih-lin   Assignee: Taiwan Semiconductor Manufacturing Company Limited   IPC: H01L27/02 Abstract: Circuits and methods for protecting a device are provided. A first device to be protected includes a gate dielectric of a first thickness. A second device includes a gate dielectric of a second thickness that is less than the first thickness. A gate is shared by the first device and the second device.
23 TW201801521A
System and method for high-speed down sampled CMOS image sensor readout
Publication/Patent Number: TW201801521A Publication Date: 2018-01-01 Application Number: 105135352 Filing Date: 2016-11-01 Inventor: Chou, Kuo-yu   Chang, Chin-hao   Yeh shang fu   Huang, Chiao-yi   Chao, Calvin Yi-ping   Lee, Chih-lin   Assignee: Taiwan Semiconductor Manufacturing Company Ltd.   IPC: H04N5/3745 Abstract: A system and method of routing multiple pixels from a single column in a CMOS (complementary metal-oxide semiconductor) image sensors (CIS) to a plurality of column analog-to-digital converters (ADCs) is disclosed. The CIS includes an array of pixel elements having a plurality of rows and a plurality of columns. A plurality of column-out signal paths is coupled to each of the plurality of columns of the array of pixel elements. A column routing matrix is coupled to each plurality of column-out signal paths for each of the plurality of columns. A plurality of analog-to-digital converters (ADCs) are coupled to the column routing matrix. The column routing matrix is configured to route at least one column-out signal path to each of the plurality of ADCs during a down-sampling read operation.
24 US2018227531A1
SYSTEM AND METHOD FOR HIGH-SPEED DOWN-SAMPLED CMOS IMAGE SENSOR READOUT
Publication/Patent Number: US2018227531A1 Publication Date: 2018-08-09 Application Number: 15/941,431 Filing Date: 2018-03-30 Inventor: Huang, Chiao-yi   Lee, Chih-lin   Yeh shang fu   Chou, Kuo-yu   Chang, Chin-hao   Chao, Calvin Yi-ping   Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.   IPC: H04N5/378 Abstract: A system and method of routing multiple pixels from a single column in a CMOS (complementary metal-oxide semiconductor) image sensors (CIS) to a plurality of column analog-to-digital converters (ADCs) is disclosed. The CIS includes an array of pixel elements having a plurality of rows and a plurality of columns. A plurality of column-out signal paths is coupled to each of the plurality of columns of the array of pixel elements. A column routing matrix is coupled to each plurality of column-out signal paths for each of the plurality of columns. A plurality of analog-to-digital converters (ADCs) are coupled to the column routing matrix. The column routing matrix is configured to route at least one column-out signal path to each of the plurality of ADCs during a down-sampling read operation.
25 US9955096B2
System and method for high-speed down-sampled CMOS image sensor readout
Publication/Patent Number: US9955096B2 Publication Date: 2018-04-24 Application Number: 15/076,983 Filing Date: 2016-03-22 Inventor: Huang, Chiao-yi   Chou, Kuo-yu   Lee, Chih-lin   Chang, Chin-hao   Yeh shang fu   Chao, Calvin Yi-ping   Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.   IPC: H04N5/378 Abstract: A system and method of routing multiple pixels from a single column in a CMOS (complementary metal-oxide semiconductor) image sensors (CIS) to a plurality of column analog-to-digital converters (ADCs) is disclosed. The CIS includes an array of pixel elements having a plurality of rows and a plurality of columns. A plurality of column-out signal paths is coupled to each of the plurality of columns of the array of pixel elements. A column routing matrix is coupled to each plurality of column-out signal paths for each of the plurality of columns. A plurality of analog-to-digital converters (ADCs) are coupled to the column routing matrix. The column routing matrix is configured to route at least one column-out signal path to each of the plurality of ADCs during a down-sampling read operation.
26 TW201713046A
Conditional correlated multiple sampling single slope analog-to-digital converter
Publication/Patent Number: TW201713046A Publication Date: 2017-04-01 Application Number: 104142050 Filing Date: 2015-12-15 Inventor: Chou, Kuo Yu   Yeh shang fu   Assignee: Taiwan Semiconductor Manufacturing Company Ltd.   IPC: H03M1/56 Abstract: A conditional correlated multiple sampling (CCMS) single slope (SS) analog-to-digital converter (ADC) is provided. The CCMS SS ADC includes a comparator
27 TWI603588B
Conditional correlated multiple sampling single slope analog-to-digital converter
Publication/Patent Number: TWI603588B Publication Date: 2017-10-21 Application Number: 104142050 Filing Date: 2015-12-15 Inventor: Chou, Kuo Yu   Yeh shang fu   Assignee: Taiwan Semiconductor Manufacturing Company Ltd.   IPC: H03M1/56 Abstract: A conditional correlated multiple sampling (CCMS) single slope (SS) analog-to-digital converter (ADC) is provided. The CCMS SS ADC includes a comparator
28 US2017162619A1
IMAGING DEVICE
Publication/Patent Number: US2017162619A1 Publication Date: 2017-06-08 Application Number: 14/963,160 Filing Date: 2015-12-08 Inventor: Chou, Kuo-yu   Yeh shang fu   Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.   IPC: H01L27/146 Abstract: A device that includes an analog-to-digital converter circuit and a control circuit is disclosed. The analog-to-digital converter circuit converts at least one of analog pixel output signals from a pixel array, to at least one of digital signals. The analog-to-digital converter circuit includes a comparator which generates a comparator output signal for operatively enabling and disabling, in accordance with a reference signal and an analog pixel output signal from the pixel array, a counter generating a digital signal. The control circuit disables, in accordance with the comparator output signal, the comparator.
29 US2017085817A1
CONDITIONAL CORRELATED MULTIPLE SAMPLING SINGLE SLOPE ANALOG-TO-DIGITAL CONVERTER, AND ASSOCIATED IMAGE SENSOR SYSTEM AND METHOD
Publication/Patent Number: US2017085817A1 Publication Date: 2017-03-23 Application Number: 14/858,175 Filing Date: 2015-09-18 Inventor: Yeh shang fu   Chou, Kuo-yu   Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.   IPC: H04N5/367 Abstract: A conditional correlated multiple sampling (CCMS) single slope (SS) analog-to-digital converter (ADC) is provided. The CCMS SS ADC includes a comparator, arranged to compare an analog signal with a ramp signal and generate a comparison result; and a CCMS control circuit, arranged to determine a swing of the ramp signal according to a magnitude of the analog signal. An image sensor system using the CCMS SS ADC and a method of CCMS SS analog-to-digital conversion are also disclosed.
30 TW201722139A
Imaging device
Publication/Patent Number: TW201722139A Publication Date: 2017-06-16 Application Number: 105138292 Filing Date: 2016-11-22 Inventor: Chou, Kuo-yu   Yeh shang fu   Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.   IPC: H04N5/369 Abstract: A device that includes an analog-to-digital converter circuit and a control circuit is disclosed. The analog-to-digital converter circuit converts at least one of analog pixel output signals from a pixel array
31 US2017280086A1
SYSTEM AND METHOD FOR HIGH-SPEED DOWN-SAMPLED CMOS IMAGE SENSOR READOUT
Publication/Patent Number: US2017280086A1 Publication Date: 2017-09-28 Application Number: 15/076,983 Filing Date: 2016-03-22 Inventor: Chao, Calvin Yi-ping   Yeh shang fu   Chang, Chin-hao   Lee, Chih-lin   Chou, Kuo-yu   Huang, Chiao-yi   Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.   IPC: H04N5/3745 Abstract: A system and method of routing multiple pixels from a single column in a CMOS (complementary metal-oxide semiconductor) image sensors (CIS) to a plurality of column analog-to-digital converters (ADCs) is disclosed. The CIS includes an array of pixel elements having a plurality of rows and a plurality of columns. A plurality of column-out signal paths is coupled to each of the plurality of columns of the array of pixel elements. A column routing matrix is coupled to each plurality of column-out signal paths for each of the plurality of columns. A plurality of analog-to-digital converters (ADCs) are coupled to the column routing matrix. The column routing matrix is configured to route at least one column-out signal path to each of the plurality of ADCs during a down-sampling read operation.
32 US9385735B2
Analog-to-digital converter for image pixels
Publication/Patent Number: US9385735B2 Publication Date: 2016-07-05 Application Number: 14/496,029 Filing Date: 2014-09-25 Inventor: Chou, Kuo-yu   Yeh shang fu   Tao, Wei Lun   Assignee: Taiwan Semiconductor Manufacturing Company Limited   IPC: H03M1/56 Abstract: One or more analog-to-digital converters and methods for analog-to-digital conversion are provided. The analog-to-digital converter comprises a ramp generator and a direct current (DC) generator respectively configured to apply a ramp voltage waveform and a DC voltage waveform to a comparator. During a pixel signal level conversion, a first portion of the ramp voltage waveform is applied to the comparator. A control circuit then makes a determination regarding an output of the comparator. If the output corresponds to a first output, or first logic state, the ramp voltage generator applies a second portion of the ramp voltage waveform to the comparator. If the output corresponds to a second output, or second logic state, the DC generator adjusts the DC voltage waveform applied to the comparator.
33 US2016094234A1
ANALOG-TO-DIGITAL CONVERTER FOR IMAGE PIXELS
Publication/Patent Number: US2016094234A1 Publication Date: 2016-03-31 Application Number: 14/496,029 Filing Date: 2014-09-25 Inventor: Chou, Kuo-yu   Yeh shang fu   Tao, Wei Lun   Assignee: Taiwan Semiconductor Manufacturing Company Limited   IPC: H03M1/00 Abstract: One or more analog-to-digital converters and methods for analog-to-digital conversion are provided. The analog-to-digital converter comprises a ramp generator and a direct current (DC) generator respectively configured to apply a ramp voltage waveform and a DC voltage waveform to a comparator. During a pixel signal level conversion, a first portion of the ramp voltage waveform is applied to the comparator. A control circuit then makes a determination regarding an output of the comparator. If the output corresponds to a first output, or first logic state, the ramp voltage generator applies a second portion of the ramp voltage waveform to the comparator. If the output corresponds to a second output, or second logic state, the DC generator adjusts the DC voltage waveform applied to the comparator.
34 JP5869604B2
SENSOR SYSTEM AND METHOD OF CREATING DATA OUT SIGNAL FOR USE IN SENSOR
Publication/Patent Number: JP5869604B2 Publication Date: 2016-02-24 Application Number: 2014049956 Filing Date: 2014-03-13 Inventor: Chou, Kuo-yu   Chao, Yi-ping   Yeh shang fu   Tao, Erik   Assignee: TAIWAN SEMICONDUCTOR MANUFACTUARING CO LTD   IPC: H04N1/028 Abstract: PROBLEM TO BE SOLVED: To provide a system and a method for reducing the transient current of a sensor.SOLUTION: A sensor system 100 includes a pixel array 104
35 US9325923B2
Systems and methods to mitigate transient current for sensors
Publication/Patent Number: US9325923B2 Publication Date: 2016-04-26 Application Number: 13/893,468 Filing Date: 2013-05-14 Inventor: Chou, Kuo-yu   Tao, Erik   Yeh shang fu   Chao, Calvin Yi-ping   Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.   IPC: H04N5/20 Abstract: A sensor system includes a pixel array, column units and a compensation circuit. The pixel array is configured to provide pixel column data. The column units are configured to generate an offset data out signal from the pixel column data. The offset data out signal includes digital offsets. The compensation circuit is configured to remove the digital offsets from the offset data out signal. The compensation circuit is also configured to generate a data out signal.
36 US9426393B2
Noise simulation flow for low noise CMOS image sensor design
Publication/Patent Number: US9426393B2 Publication Date: 2016-08-23 Application Number: 14/177,241 Filing Date: 2014-02-11 Inventor: Yeh shang fu   Chou, Kuo-yu   Chen, Yi-che   Tao, Wei Lun   Tu, Honyih   Chao, Calvin Yi-ping   Hsueh, Fu-lung   Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.   IPC: H04N17/00 Abstract: A method for noise simulation of a CMOS image sensor comprises performing a frequency domain noise simulation for a readout circuit of the CMOS image sensor using a computer, wherein the readout circuit includes a correlated double sampling (CDS) circuit, wherein the frequency domain noise simulation includes a CDS transfer function to refer a noise introduced by the CDS circuit back to an input node of the readout circuit. The method further comprises calculating noise at the input node of the readout circuit based on the referred back noises caused by one or more components in the readout circuit and estimating noise of the CMOS imaging sensor by comparing the calculated noise at the input node of the readout circuit to an original input signal to the readout circuit of the CMOS imaging sensor.
37 US9007078B2
Pixel array module with self-test function and method thereof
Publication/Patent Number: US9007078B2 Publication Date: 2015-04-14 Application Number: 13/539,486 Filing Date: 2012-07-01 Inventor: Hsieh, Chih-cheng   Yeh shang fu   Yeh, Ka-yi   Assignee: Industrial Technology Research Institute   IPC: G01R31/00 Abstract: A pixel array module with a self-test function including a test circuit unit, a plurality of test lines, and a pixel array is provided. The test circuit unit provides the self-test function. The test lines are connected between the test circuit unit and the pixel array. The pixel array is connected to the test circuit unit through the test lines and includes a plurality of pixels. Each pixel includes a transistor. Each transistor has a first terminal and a second terminal. Regarding each of the pixels, a driving signal of the transistor is transmitted from the first terminal to the second terminal thereof under a normal mode, and a test signal of the transistor is transmitted from the second terminal to the first terminal thereof under a test mode. Furthermore, a self-test method of the foregoing pixel array module is also provided.
38 US9029753B2
Optical recognition system and method thereof
Publication/Patent Number: US9029753B2 Publication Date: 2015-05-12 Application Number: 13/628,667 Filing Date: 2012-09-27 Inventor: Hsieh, Chih-cheng   Yeh shang fu   Liu, Chun-kai   Cheng, Chiao-jen   Assignee: National Tsing Hua University   IPC: H01L27/146 Abstract: The present invention is related to an optical recognition system and a method thereof, and more particularly to an optical recognition system and a method that adopts a single-slope analog-to-digital converter to proceed a single-slope analog-to-digital conversion in order to have an image with a wide dynamic range.
39 US2015116506A1
NOISE SIMULATION FLOW FOR LOW NOISE CMOS IMAGE SENSOR DESIGN
Publication/Patent Number: US2015116506A1 Publication Date: 2015-04-30 Application Number: 14/177,241 Filing Date: 2014-02-11 Inventor: Yeh shang fu   Chou, Kuo-yu   Chen, Yi-che   Tao, Wei Lun   Tu, Honyih   Chao, Calvin Yi-ping   Hsueh, Fu-lung   Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.   IPC: H04N5/357 Abstract: A method for noise simulation of a CMOS image sensor comprises performing a frequency domain noise simulation for a readout circuit of the CMOS image sensor using a computer, wherein the readout circuit includes a correlated double sampling (CDS) circuit, wherein the frequency domain noise simulation includes a CDS transfer function to refer a noise introduced by the CDS circuit back to an input node of the readout circuit. The method further comprises calculating noise at the input node of the readout circuit based on the referred back noises caused by one or more components in the readout circuit and estimating noise of the CMOS imaging sensor by comparing the calculated noise at the input node of the readout circuit to an original input signal to the readout circuit of the CMOS imaging sensor.
40 TWI424746B
Image sensor and sensing method thereof
Publication/Patent Number: TWI424746B Publication Date: 2014-01-21 Application Number: 100104778 Filing Date: 2011-02-14 Inventor: Hsieh, Chih Cheng   Yeh shang fu   Yeh, Ka Yi   Assignee: Industrial Technology Research Institute   IPC: H04N5/374 Abstract: An image sensor including a pixel array is provided. The pixel array includes R x S sub-pixel arrays. The sub-pixel array includes P x Q pixels. Each pixel includes a photodiode