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No. Publication Number Title Publication/Patent Number Publication/Patent Number Publication Date Publication Date
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1 EP3698174A1
MODULAR GAMMA IMAGING DEVICE
Publication/Patent Number: EP3698174A1 Publication Date: 2020-08-26 Application Number: 18816217.6 Filing Date: 2018-10-19 Inventor: Hugg, James William   Harris, Brian William   Walker, Franklin Dean   Thomson, Sarah Melissa   Mcvay, Brian Patrick   Clajus, Rolf Martin   Assignee: Kromek Group, Plc   IPC: G01T1/24
2 US2020183023A1
DIRECT CONVERSION RADIATION DETECTION
Publication/Patent Number: US2020183023A1 Publication Date: 2020-06-11 Application Number: 16/623,462 Filing Date: 2018-06-21 Inventor: Steadman, Booker Roger   Herrmann, Christoph   Assignee: KONINKLIJKE PHILIPS N.V.   IPC: G01T1/24 Abstract: The invention relates to a radiation detector (1), an imaging system and a related method for radiation detection. The detector comprises a direct conversion material (2) for converting x-ray and/or gamma radiation into electron-hole pairs by direct photon-matter interaction. The detector comprises an anode (3) and a cathode (4) arranged on opposite sides of the direct conversion material (2) such that the electrons and holes can respectively be collected by the anode and cathode. The cathode is substantially transparent to infrared radiation. The detector comprises a light guide layer (5) on the cathode at a side of the cathode that is opposite of the direct conversion material, in which the light guide layer is adapted for distributing infrared radiation over the direct conversion material. The detector comprises a reflector layer (6) arranged on the light guide layer (5) at a side opposite of the cathode, in which the reflector layer is adapted for substantially reflecting infrared radiation. The detector comprises at least one light emitter (7), abutting on and/or integrated in the light guide layer (5), for emitting infrared radiation into the light guide layer.
3 US2020064498A1
SENSITIVITY CORRECTION METHOD AND PHOTON COUNTING DETECTOR
Publication/Patent Number: US2020064498A1 Publication Date: 2020-02-27 Application Number: 16/540,147 Filing Date: 2019-08-14 Inventor: Nakai, Hiroaki   Miyazaki, Hiroaki   Kato, Tooru   Hayashi, Mikihito   Sugihara, Naoki   Assignee: Canon Medical Systems Corporation   IPC: G01T1/24 Abstract: According to one embodiment, a sensitivity correction method includes acquiring count rates for respective pixels in a photon counting detector; preparing incident dose adjustment materials for the respective pixels based on the count rates for the respective pixels; and providing the incident dose adjustment materials in a surface of the photon counting detector.
4 EP2929372B1
METHOD AND APPARATUS FOR IMAGE CORRECTION OF X-RAY IMAGE INFORMATION
Publication/Patent Number: EP2929372B1 Publication Date: 2020-05-27 Application Number: 13815570.0 Filing Date: 2013-09-29 Inventor: Herrmann, Christoph   Assignee: Koninklijke Philips N.V.   IPC: G01T1/24
5 EP3646064A1
SEMICONDUCTOR PHOTOMULTIPLIER WITH IMPROVED OPERATING VOLTAGE RANGE
Publication/Patent Number: EP3646064A1 Publication Date: 2020-05-06 Application Number: 18746155.3 Filing Date: 2018-07-25 Inventor: Daly, Paul Malachy   Jackson, John Carlton   Assignee: SENSL Technologies Ltd.   IPC: G01T1/24
6 CN110678782A
用于X射线成像的检测器
Under Examination
Title (English): Detector for x ray imaging
Publication/Patent Number: CN110678782A Publication Date: 2020-01-10 Application Number: 201880032096.6 Filing Date: 2018-05-08 Inventor: 马茨·丹尼尔松   斯塔凡·卡尔松   托尔比约恩·耶恩   许成   Assignee: 棱镜传感器公司   IPC: G01T1/24 Abstract: 公开了一种边缘接通光子计数检测器以及用于制造这种检测器的电荷收集侧的方法。边缘接通光子计数检测器包括半导体衬底。该半导体衬底包括:适于面对x射线源的第一端和在入射x射线的方向上与第一端相对的第二端;以及至少一个具有N个深度片段的条带,N>2,每个深度片段包括电荷收集金属电极和包括掺杂区和绝缘区的电荷收集侧,其中,每个电荷收集金属电极布置在相应的掺杂区上方,并且连接到布置在绝缘区上的相应的布线迹线,相应的布线迹线适于将来自电荷收集金属电极的信号传导至布置在第二端的能连接至前端电子设备的读出焊盘E。
7 CN110914716A
用于与辐射检测器一起使用的散射校正技术
Under Examination
Title (English): Scattering correction techniques used with radiation detectors
Publication/Patent Number: CN110914716A Publication Date: 2020-03-24 Application Number: 201880026554.5 Filing Date: 2018-05-07 Inventor: 乌韦·维德曼   布莱恩·大卫·亚诺夫   比朱·雅各布   芮雪   金燕南   Assignee: 通用电气公司   IPC: G01T1/24 Abstract: 本方法涉及逐像素地使用辐射检测器采集的信号的散射校正。在某些实施方式中,本文公开的系统和方法便于使用具有分段检测器元件的检测器生成的信号的散射校正,诸如可以存在于能量分辨光子计数CT成像系统中。
8 CN111226140A
模块化伽马成像设备
Under Examination
Publication/Patent Number: CN111226140A Publication Date: 2020-06-02 Application Number: 201880067944.7 Filing Date: 2018-10-19 Inventor: 詹姆士·威廉·胡格   布雷恩·威廉·哈里斯   富兰克林·迪安·沃克   萨拉·梅利莎·汤姆森   布雷恩·帕特里克·麦克维   罗尔夫·马丁·克拉尤斯   Assignee: 克罗梅克集团公开有限责任公司   IPC: G01T1/24 Abstract: 一个实施例提供了一种成像设备,包括:外壳,包括壳体和布置在所述壳体内以提供辐射屏蔽的辐射衬层,其中,所述外壳包括可移除部分;多个模块化组件,与校准代码通信,其中,所述校准代码基于所述多个模块化组件的信息来校准所述成像设备;所述多个模块化组件中的每一个包括多个伽马检测器,所述伽马检测器包括半导体晶体,并且能够从所述成像设备移除;所述多个模块化组件被布置为使得所述多个伽马检测器以阵列配置进行配置,其中,所述多个伽马检测器中的每一个彼此具有预定的间隔;多个电子通信组件,其中,所述多个电子通信组件使用分层通信技术来促进来自每个伽马检测器的通信;以及冷却系统。
9 CN110914714A
制造和使用X射线检测器的方法
Under Examination
Title (English): Methods of manufacturing and using x ray detectors
Publication/Patent Number: CN110914714A Publication Date: 2020-03-24 Application Number: 201780093158.X Filing Date: 2017-07-26 Inventor: 曹培炎   刘雨润   Assignee: 深圳帧观德芯科技有限公司   IPC: G01T1/24 Abstract: 本文公开了制造和使用适于X射线检测的吸收单元阵列的方法以及包括这种吸收单元阵列的检测器。制造吸收单元阵列(410)的方法可包括在基板(400)上形成吸收单元阵列(410A),并且在从基板(400)分离吸收单元阵列(410)之后形成保护环(431A,431B),其包围吸收单元阵列(410)的多于一个吸收单元(420);或者可包括在从基板(400)分离出一部分之后在基板(400)的该部分上形成多个吸收单元(420),以及包围多于一个吸收单元(420)的保护环(431B)。使用吸收单元阵列(410)的方法可包括通过施加电压将吸收单元阵列(410)的一些吸收单元(420)用作保护环(431B)。适于X射线检测的检测器(100)包括吸收层(110)和电子层(120),其中吸收层(110)包括吸收单元阵列(410)。
10 CN111480096A
静电放电保护的半导体光电倍增器
Under Examination
Publication/Patent Number: CN111480096A Publication Date: 2020-07-31 Application Number: 201880080995.3 Filing Date: 2018-07-25 Inventor: P·m·戴利   J·c·杰克逊   B·p·麦加维   S·j·贝里斯   Assignee: 森斯尔科技有限公司   IPC: G01T1/24 Abstract: 本公开涉及一种半导体光电倍增器,该半导体光电倍增器包括位于衬底上并具有至少一个端子的一个或多个微单元。至少一个ESD保护元件可操作地耦接到至少一个端子。
11 CN111587388A
制作辐射检测器的方法
Public
Publication/Patent Number: CN111587388A Publication Date: 2020-08-25 Application Number: 201880086361.9 Filing Date: 2018-01-24 Inventor: 曹培炎   刘雨润   Assignee: 深圳帧观德芯科技有限公司   IPC: G01T1/24 Abstract: 本文所公开的是一种形成辐射检测器的方法。该方法包括形成辐射吸收层,并且将电子层接合到辐射吸收层。电子层包括电子系统,其配置成处理吸收辐射光子时在辐射吸收层生成的电信号。形成辐射吸收层的方法包括:将沟槽形成到半导体衬底的第一表面中;掺杂沟槽的侧壁;在第一表面上形成第一电触点;在半导体衬底的第二表面上形成第二电触点。第二表面与第一表面相对。该方法还包括沿沟槽来切分半导体衬底。
12 EP3726254A1
HIGH-PURITY GERMANIUM DETECTOR
Publication/Patent Number: EP3726254A1 Publication Date: 2020-10-21 Application Number: 18819518.4 Filing Date: 2018-12-11 Inventor: Li, Yulan   Li, Hong   Chang, Jianping   Zhang, Zhi   Li, Jianmin   Assignee: Tsinghua University   Nuctech Company Limited   IPC: G01T1/24 Abstract: The present disclosure provides a high-purity-germanium detector. The high-purity-germanium detector includes: an array of high-purity germanium crystal units including two or more high-purity germanium crystal units, wherein, each of the two or more high-purity germanium crystal units comprises a partial electrode on a side surface and/or a first top surface, and the electrodes on the side surfaces and/or the first top surfaces of the two or more high-purity germanium crystal units are electrically connected together to form a first contact electrode of the high- purity-germanium detector; and each of the high-purity germanium crystal units comprises a respective second contact electrode therein, such that the high-purity-germanium detector comprises two or more second contact electrodes.
13 US2020072986A1
Semiconductor X-ray Detector
Publication/Patent Number: US2020072986A1 Publication Date: 2020-03-05 Application Number: 16/676,425 Filing Date: 2019-11-06 Inventor: Cao, Peiyan   Liu, Yurun   Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.   IPC: G01T1/24 Abstract: Disclosed herein is an apparatus suitable for detecting X-ray, comprising: an X-ray absorption layer comprising an electrode; an electronics layer, the electronics layer comprising: a substrate having a first surface and a second surface, an electronics system in or on the substrate, an electric contact on the first surface, and a first via extending from the first surface toward the second surface; wherein the electrode is electrically connected to the electric contact; wherein the electronics system comprises a controller connected in series with and between the electric contact and the first via.
14 EP3596511A1
PIXEL-DESIGN FOR USE IN A RADIATION DETECTOR
Publication/Patent Number: EP3596511A1 Publication Date: 2020-01-22 Application Number: 18701909.6 Filing Date: 2018-01-11 Inventor: Fu, Geng   Rui, Xue   Jin, Yannan   Guo, Jianjun   Edic, Peter Michael   Yanoff, Brian David   Assignee: General Electric Company   IPC: G01T1/24
15 EP3384320B1
RADIATION DETECTOR AND IMAGING APPARATUS
Publication/Patent Number: EP3384320B1 Publication Date: 2020-03-11 Application Number: 16810277.0 Filing Date: 2016-12-02 Inventor: Steadman, Booker Roger   Ribbing, Carolina   Ruetten, Walter   Vogtmeier, Gereon   Assignee: Koninklijke Philips N.V.   IPC: G01T1/24
16 EP3605151A1
PHOTON COUNTING DETECTOR
Publication/Patent Number: EP3605151A1 Publication Date: 2020-02-05 Application Number: 18186822.5 Filing Date: 2018-08-01 Inventor: Steadman, Booker Roger   Roessl, Ewald   Assignee: Koninklijke Philips N.V.   IPC: G01T1/24 Abstract: The present invention relates to Photon counting detector comprising a first direct conversion layer (10) comprising a low-absorption direct conversion material (11) for converting impinging high-energy electromagnetic radiation (100) into a first count signal and first electrical contacts (12), a second direct conversion layer (20) comprising a high-absorption direct conversion material (21) for converting impinging high-energy electromagnetic radiation (100) into a second count signal and second electrical contacts (22), said high-absorption direct conversion material having a higher absorption than said low-absorption direct conversion material, and a carrier layer (30, 30a, 30b) comprising first and second terminals (31, 32) in contact with the first and second electrical contacts and processing circuitry (35) configured to correct, based on the first count signal, the second count signal for errors, wherein said first direct conversion layer and the second direct conversion layer are arranged such that the high-energy electromagnetic radiation transmits the first direct conversion layer before it hits the second direct conversion layer.
17 EP3674752A1
DETECTOR SYSTEM AND RADIATION IMAGING DEVICE
Publication/Patent Number: EP3674752A1 Publication Date: 2020-07-01 Application Number: 19218667.4 Filing Date: 2019-12-20 Inventor: Tian, Yang   Li, Yulan   Assignee: Nuctech Company Limited   Tsinghua University   IPC: G01T1/24 Abstract: The present disclosure provides a detector system and a radiation imaging device. The detector system comprises: a detector, including a plurality of detector layers that are overlapped, wherein the detector layer comprises a detector element layer and at least one of the detector layers is movable along the thickness direction of the detector layers; a distance adjusting device drivingly connected with at least one of the detector layers to adjust the inter-layer distance between adjacent detector layers of the detector by moving at least one of the detector layers along the thickness of the detector layers. The radiation imaging device comprises the detector system described above. The detector system and the radiation imaging device of the present disclosure are conductive to realizing an omnidirectional and efficient detection effect with high angular resolution.
18 CN111095027A
具有改进的工作电压范围的半导体光电倍增器
Under Examination
Publication/Patent Number: CN111095027A Publication Date: 2020-05-01 Application Number: 201880056856.7 Filing Date: 2018-07-25 Inventor: P·m·戴利   J·c·杰克逊   Assignee: 森斯尔科技有限公司   IPC: G01T1/24 Abstract: 本公开涉及一种半导体光电倍增器(100),其包括互连微单元的阵列;其中所述阵列至少包括:具有第一几何形状的第一结区的第一类型的微单元(125);以及具有第二几何形状的第二结区的第二类型的微单元(225)。
19 US202025954A1
RADIATION IMAGING METHOD
Publication/Patent Number: US202025954A1 Publication Date: 2020-01-23 Application Number: 20/191,658 Filing Date: 2019-09-30 Inventor: Lee, Denny Lap Yen   Assignee: VIEWORKS CO., LTD.   IPC: G01T1/24 Abstract: A method of operating a radiation imaging system includes applying a bias voltage to a top electrode, receiving ionization radiation, wherein the ionization radiation penetrates an electrical insulation layer and generate a charge signal, storing the charge signal in a storage capacitor among a plurality of storage capacitors, changing a polarity of a gate line bias voltage of one row of transistors among a plurality of transistors, and integrating charges from storage capacitors connected to each other along orthogonal data lines. The imaging system includes an electrical insulation layer having a top surface and a bottom surface, a top electrode on the top surface of the electrical insulation layer, a plurality of pixel units electrically coupled to the electrical insulation layer, the plurality of pixel units including a plurality of storage capacitors, and a plurality of transistors connected to the plurality of pixel units such that a respective transistor is connected to each of the plurality of pixel units.
20 US202018865A1
IMAGE PROCESSING WITH IMPROVED RESOLUTION ISOTROPY
Publication/Patent Number: US202018865A1 Publication Date: 2020-01-16 Application Number: 20/181,648 Filing Date: 2018-02-13 Inventor: Devir, Zvi   Kenig, Tal   Assignee: MOLECULAR DYNAMICS LIMITED   IPC: G01T1/24 Abstract: A method of processing a SPECT image of a region of interest is disclosed. The SPECT image was obtained using at least one gamma detector detecting gamma radiation from the region of interest at multiple detector configurations, and the method includes: obtaining data indicative of the detector configurations and their spatial relationships to the region of interest; determining a resolution level for each of a plurality of directions in each point in the image based on the data obtained; and processing the image based on the resolution levels determined.