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1
US20190086341A1
Publication/Patent Number: US20190086341A1
Publication date: 2019-03-21
Application number: 16/085,464
Filing date: 2017-02-20
Abstract: First ROI pixel values of a first region of interest 101 of a radiographic intensity distribution image 10, and second ROI pixel values of a second region of interest 102 of the radiographic intensity distribution image 10, are acquired. One of the first and second regions of interest is set to be at a position, or vicinity thereof, where a phase difference in the intensity modulation period within the radiographic intensity distribution image, with respect to the other region of interest, becomes π/2. Next, an elliptical locus obtained by plotting the first and second ROI pixel values for each radiographic intensity distribution image is determined. k angle region images are then acquired using the radiographic intensity distribution images corresponding to at least k angle regions that have been obtained by dividing the elliptical locus for each given angle. A radiographic image is then generated using the k angle region images. k is an integer of three or more. First ROI pixel values of a first region of interest 101 of a radiographic intensity distribution image 10, and second ROI pixel values of a second region of interest 102 of the radiographic intensity distribution image 10, are acquired. One of the first and second regions of ...more ...less
2
US20190025232A1
Publication/Patent Number: US20190025232A1
Publication date: 2019-01-24
Application number: 16/033,739
Filing date: 2018-07-12
Abstract: This X-ray phase imaging apparatus is provided with a control unit that acquires information on a defect of a material based on a dark field image of the material.
3
US20190041400A1
Publication/Patent Number: US20190041400A1
Publication date: 2019-02-07
Application number: 16/045,879
Filing date: 2018-07-26
Abstract: The present invention relates to the field of GPCR structure biology and signaling. In particular, the present invention relates to protein binding domains directed against or capable of specifically binding to a functional conformational state of a G-protein-coupled receptor (GPCR). More specifically, the present invention provides protein binding domains that are capable of increasing the stability of a functional conformational state of a GPCR, in particular, increasing the stability of a GPCR in its active conformational state. The protein binding domains of the present invention can be used as a tool for the structural and functional characterization of G-protein-coupled receptors bound to various natural and synthetic ligands, as well as for screening and drug discovery efforts targeting GPCRs. Moreover, the invention also encompasses the diagnostic, prognostic and therapeutic usefulness of these protein binding domains for GPCR-related diseases. The present invention relates to the field of GPCR structure biology and signaling. In particular, the present invention relates to protein binding domains directed against or capable of specifically binding to a functional conformational state of a G-protein-coupled receptor ...more ...less
4
EP3436796A1
Publication/Patent Number: EP3436796A1
Publication date: 2019-02-06
Application number: 17714174.4
Filing date: 2017-03-27
Inventor: Teutenberg, Reinhard  
5
EP3431971A1
Publication/Patent Number: EP3431971A1
Publication date: 2019-01-23
Application number: 18181911.1
Filing date: 2018-07-05
Abstract: This X-ray phase imaging apparatus (100) is provided with a control unit (6b) that acquires information on a defect of a material based on a dark field image of the material (T).
6
US10209207B2
Publication/Patent Number: US10209207B2
Publication date: 2019-02-19
Application number: 15/226,667
Filing date: 2016-08-02
Inventor: Handa, Soichiro  
Abstract: An X-ray Talbot interferometer includes a source grating having a plurality of X-ray transmitting portions to transmit some X-rays from an X-ray source, a beam splitter grating configured to diffract the X-rays from the X-ray transmitting portions with a periodic structure to form interference patterns, an analyzer grating configured to block parts of the interference patterns, and a detector configured to detect X-rays from the analyzer grating. The X-ray transmitting portions of the source grating are arranged to form a periodic pattern in which spatial frequency components contained in a sideband resulting from modulation caused by the presence of an object are enhanced by superimposing the interference patterns corresponding to the respective X-ray transmitting portions. In the absence of any object, the positional relation between the periodic pattern and the grating pattern of the analyzer grating is substantially the same over the entire imaging field. An X-ray Talbot interferometer includes a source grating having a plurality of X-ray transmitting portions to transmit some X-rays from an X-ray source, a beam splitter grating configured to diffract the X-rays from the X-ray transmitting portions with a periodic structure to ...more ...less
7
US10239229B2
Publication/Patent Number: US10239229B2
Publication date: 2019-03-26
Application number: 15/111,748
Filing date: 2014-02-18
Abstract: Systems, methods, and computer-readable storage devices for scanning a retrieved geological core sample to produce a digital file representing the core sample. Then the digital file is transmitted to a three-dimensional printer that can execute the digital file to make a geologically, chemically, and structurally equivalent replica of the retrieved geological core sample. The three-dimensional printer can optionally combine a base geological material with one or more additives or with an inert binding agent layer by layer as three-dimensional pixels. The replica core sample can then be used for testing or for other purposes at a greatly reduced cost than retrieving multiple actual core samples. Further, the replica core sample can be reproduced at virtually any location rather than transporting an actual core sample. Systems, methods, and computer-readable storage devices for scanning a retrieved geological core sample to produce a digital file representing the core sample. Then the digital file is transmitted to a three-dimensional printer that can execute the digital file to make a ...more ...less
8
US20190094161A1
Publication/Patent Number: US20190094161A1
Publication date: 2019-03-28
Application number: 16/139,901
Filing date: 2018-09-24
Abstract: A system includes a focusing system, a radiation detector, and a controller. The focusing system is configured to receive an incident radiation beam from a radiation source and focus the incident radiation beam on a portion of a component of a high temperature mechanical system. The incident radiation beam scatters from the portion of the component as a diffracted radiation beam. The focusing system is further configured to focus the diffracted radiation beam from the portion of the component on the radiation detector. The radiation detector is configured to detect a diffraction pattern of the diffracted radiation beam from the portion of the component. The controller is configured to determine a temperature of the portion of the component based on the diffraction pattern. A system includes a focusing system, a radiation detector, and a controller. The focusing system is configured to receive an incident radiation beam from a radiation source and focus the incident radiation beam on a portion of a component of a high temperature mechanical system ...more ...less
9
EP3469343A1
Publication/Patent Number: EP3469343A1
Publication date: 2019-04-17
Application number: 17728895.8
Filing date: 2017-06-13
10
US10168208B2
Publication/Patent Number: US10168208B2
Publication date: 2019-01-01
Application number: 15/561,190
Filing date: 2016-03-16
Abstract: A signal detected by a photomultiplier tube is pre-amplified and converted into a digital signal. A time average value of signal components, each of which has a voltage lower than a predetermined base threshold value, is calculated as a base voltage. A signal that has been subjected to base correction processing is subjected to threshold value processing and to base correction processing in a non-incident state in which light is not incident on the photomultiplier tube. An output signal thereof is subjected to dark current calculation processing; and a light emission signal amount is calculated by subtracting, from the signal component of the detection light obtained by the threshold value processing, a time average value of the signal components of the dark current. As the result, discriminating the dark current pulse from floor noises enhances the accuracy of the base voltage, and thus the accuracy of light detection. A signal detected by a photomultiplier tube is pre-amplified and converted into a digital signal. A time average value of signal components, each of which has a voltage lower than a predetermined base threshold value, is calculated as a base voltage. A signal that has been ...more ...less
11
EP3454051A1
Publication/Patent Number: EP3454051A1
Publication date: 2019-03-13
Application number: 17189540.2
Filing date: 2017-09-06
Inventor: Koehler, Thomas  
Abstract: The present invention relates to a grating for X-ray phase contrast and/or dark-field imaging. It is described to form a photo-resist layer on a surface of a substrate. The photo-resist layer is illuminated with radiation using a mask representing a desired grating structure. The photo-resist layer is etched to remove parts of the photo-resist layer, to leave a plurality of trenches that are laterally spaced from one across the surface of the substrate. A plurality of material layers are formed on the surface of the substrate. Each layer is formed in a trench. A material layer comprises a plurality of materials, wherein the plurality of materials are formed one on top of the other in a direction perpendicular to the surface of the substrate. The plurality of materials comprises at least one material that has a k-edge absorption energy that is higher than the k-edge absorption energy of Gold and the plurality of materials comprises Gold. The present invention relates to a grating for X-ray phase contrast and/or dark-field imaging. It is described to form a photo-resist layer on a surface of a substrate. The photo-resist layer is illuminated with radiation using a mask representing a desired grating structure ...more ...less
12
US10273593B2
Publication/Patent Number: US10273593B2
Publication date: 2019-04-30
Application number: 15/221,167
Filing date: 2016-07-27
Abstract: An electrochemical cell that allows for in-situ structural characterization of amorphous thin film materials during the course of electrolysis using high-energy X-ray scattering (>50 keV). The compact and versatile cell employs a three-electrode configuration and minimizes X-ray scattering contributions from the cell, reference and counter electrodes, as well as the working electrode support. A large surface area working electrode has a physically robust support and is largely transparent to X-rays. This design, which utilizes a three-dimensional working electrode, also greatly improves the intensity and quality of the scattered signal compared to a two-dimensional working electrode. The in-situ cell can be used not only to investigate structural evolution during electrolysis using X-ray scattering (e.g. pair distribution function), but also to perform electrochemical potential-dependent structural analysis by extended X-ray absorption fine structure. An electrochemical cell that allows for in-situ structural characterization of amorphous thin film materials during the course of electrolysis using high-energy X-ray scattering (>50 keV). The compact and versatile cell employs a three-electrode configuration and minimizes ...more ...less
13
EP3470827A3
Publication/Patent Number: EP3470827A3
Publication date: 2019-05-01
Application number: 18198983.1
Filing date: 2018-10-05
Inventor: Hoenes, Katja  
Abstract: In an embodiment, a method for determining the concentration of an element of a heteroepitaxial layer includes generating a reciprocal space map in Qz and Qx directions in a portion of reciprocal space describing positions of diffracted X-ray peaks of a heteroepitaxial layer and of a substrate on which the heteroepitaxial layer is positioned, determining the position of a diffracted X-ray peak of the substrate in the reciprocal space map in the Qx direction, determining the expected position of the diffracted X-ray peak of the heteroepitaxial layer in the Qx direction based on the determined position of the diffracted X-ray peak of the substrate in the Qx direction, generating a scan of the heteroepitaxial layer in a Qz direction at the expected position in the Qx direction, and determining the concentration of a constituent element of the heteroepitaxial layer based on the scan. In an embodiment, a method for determining the concentration of an element of a heteroepitaxial layer includes generating a reciprocal space map in Qz and Qx directions in a portion of reciprocal space describing positions of diffracted X-ray peaks of a heteroepitaxial layer and ...more ...less
14
EP3460893A1
Publication/Patent Number: EP3460893A1
Publication date: 2019-03-27
Application number: 17192263.6
Filing date: 2017-09-21
Inventor: Kriele, Armin  
Abstract: Die Erfindung betrifft eine Vorrichtung (1) zum Einspannen von flachen Proben (6), insbesondere von Pouch-Batteriezellen, für die Röntgendiffraktometrie, wobei die Vorrichtung ein Gehäuse (2) mit einer Probenhalterung (4), die gegeneinander verspannbare Haltelemente (5) zum Einspannen der Probe (6) aufweist, wenigstens zwei Röntgenfenster (11a, 11b, 12) zum Ein- und Auslassen von Röntgenstrahlen, und mindestens eine erste Temperiereinrichtung (7), zum Temperieren der Probe (6), aufweist. An den Halteelementen (5) ist jeweils wenigstens eine erste Temperiereinrichtung (7) angebracht, wobei die ersten Temperiereinrichtungen (7) mit dem Gehäuse (2) thermisch gekoppelt sind, und die Vorrichtung weist wenigstes eine zweite Temperiereinrichtung (9) auf, die dazu eingerichtet ist, Wärme, die von der ersten Temperiereinrichtung (7) an das Gehäuse (2) abgegeben wird, aus dem Gehäuse (3) nach außen abzuführen und/oder Wärme von außen in das Gehäuse (2) einzubringen. Die Erfindung betrifft eine Vorrichtung (1) zum Einspannen von flachen Proben (6), insbesondere von Pouch-Batteriezellen, für die Röntgendiffraktometrie, wobei die Vorrichtung ein Gehäuse (2) mit einer Probenhalterung (4), die gegeneinander verspannbare Haltelemente (5) zum Ei ...more ...less
15
EP3502676A1
Publication/Patent Number: EP3502676A1
Publication date: 2019-06-26
Application number: 18214861.9
Filing date: 2018-12-20
Inventor: Gergaud, Patrice  
Abstract: Méthode de détermination du coefficient de dilatation thermique d'un film mince en matériau cristallin déposé sur un substrat, comportant : a) la structuration d'une partie au moins du film mince cristallin de sorte à former un réseau de plots dont la hauteur est au moins égale à l'épaisseur du film mince, b) la mesure du paramètre de maille du matériau du film mince par diffraction dans le réseau à plusieurs températures données, c) détermination du coefficient de dilatation thermique à partir des paramètres de mailles mesurés aux différentes températures. Méthode de détermination du coefficient de dilatation thermique d'un film mince en matériau cristallin déposé sur un substrat, comportant : a) la structuration d'une partie au moins du film mince cristallin de sorte à former un réseau de plots dont la hauteur est au moins égale ...more ...less
16
EP2845169B1
Publication/Patent Number: EP2845169B1
Publication date: 2019-05-22
Application number: 13722010.9
Filing date: 2013-05-03
Inventor: Maiden, Andrew  
17
US10309912B2
Publication/Patent Number: US10309912B2
Publication date: 2019-06-04
Application number: 15/919,496
Filing date: 2018-03-13
Abstract: Methods and apparatus are provided for performing back-reflection energy-dispersive X-ray diffraction (XRD). This exhibits extremely low sensitivity to the morphology of the sample under investigation. As a consequence of this insensitivity, unprepared samples can be analyzed using this method. For example, in a geological context, whole rock samples become amenable to analysis. A composite diffraction spectrum can be produced using information from different recorded spectra in different energy sub-ranges. The composite spectrum excludes fluorescence signals that would otherwise obscure the diffraction signals. Methods and apparatus are provided for performing back-reflection energy-dispersive X-ray diffraction (XRD). This exhibits extremely low sensitivity to the morphology of the sample under investigation. As a consequence of this insensitivity, unprepared samples can be analyzed ...more ...less